Apostolos T. Voutsas

According to our database, Apostolos T. Voutsas authored at least 9 papers between 2004 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

A temperature study of photosensitivity in SLS polycrystalline silicon TFTs.

Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas

Microelectron. Reliab., 2012

2010

On the importance of the V_{g, max}-V_th parameter on LTPS TFT stressing behavior.

Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas

Microelectron. Reliab., 2010

Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress.

Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas

Microelectron. Reliab., 2010

2008

Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.

Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas

Microelectron. Reliab., 2008

2007

Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.

Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas

Microelectron. Reliab., 2007

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.

Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas

Microelectron. Reliab., 2007

Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress.

F. V. Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas

Microelectron. Reliab., 2007

Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors.

Vojkan Davidovic, Dimitrios N. Kouvatsos, Ninoslav Stojadinovic, Apostolos T. Voutsas

Microelectron. Reliab., 2007

2004

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.

Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis

Microelectron. Reliab., 2004