Loukas Michalas
Orcid: 0000-0002-0753-2574
According to our database1,
Loukas Michalas
authored at least 18 papers
between 2004 and 2021.
Collaborative distances:
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Bibliography
2021
2019
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Live Demonstration: An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
2016
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness.
Microelectron. Reliab., 2016
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches.
Microelectron. Reliab., 2016
2015
Microelectron. Reliab., 2015
Induced charging phenomena on SiN<sub>x</sub> dielectric films used in RF MEMS capacitive switches.
Microelectron. Reliab., 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
2014
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches.
Microelectron. Reliab., 2014
2013
Microelectron. Reliab., 2013
2012
Microelectron. Reliab., 2012
Microelectron. Reliab., 2012
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches.
Microelectron. Reliab., 2012
2010
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress.
Microelectron. Reliab., 2010
2007
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2007
2004
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2004