Loukas Michalas

According to our database, Loukas Michalas authored at least 18 papers between 2004 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Emulating homoeostatic effects with metal-oxide memristors T-dependence.

Thomas Abbey, Alexantrou Serb, Spyros Stathopoulos, Loukas Michalas, Themis Prodromakis

CoRR, 2021

2019

A Digital In-Analogue Out Logic Gate Based on Metal-Oxide Memristor Devices.

Georgios Papandroulidakis, Loukas Michalas, Alexander Serb, Ali Khiat, Geoff V. Merrett, Themistoklis Prodromakis

Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

2018

Metal Oxide-enabled Reconfigurable Memristive Threshold Logic Gates.

Georgios Papandroulidakis, Ali Khiat, Alexander Serb, Spyros Stathopoulos, Loukas Michalas, Themis Prodromakis

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation.

Thomas Abbey, Alexandru Serb, Nikolaos Vasilakis, Loukas Michalas, Ali Khiat, Spyros Stathopoulos, Themis Prodromakis

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Live Demonstration: An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation.

Thomas Abbey, Alexander Serb, Nikolaos Vasilakis, Loukas Michalas, Ali Khiat, Spyros Stathopoulos, Themis Prodromakis

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2016

Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness.

Matroni Koutsoureli, Athanasios Zevgolatis, Samuel Saada, Christine Mer-Calfati, Loukas Michalas, George J. Papaioannou, Philippe Bergonzo

Microelectron. Reliab., 2016

An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches.

Matroni Koutsoureli, Dimitrios Birmpiliotis, Loukas Michalas, George J. Papaioannou

Microelectron. Reliab., 2016

2015

Dielectric charging effects in floating electrode MEMS capacitive switches.

Loukas Michalas, Matroni Koutsoureli, E. Papandreou, Flavio Giacomozzi, George J. Papaioannou

Microelectron. Reliab., 2015

Induced charging phenomena on SiN_x dielectric films used in RF MEMS capacitive switches.

Matroni Koutsoureli, Loukas Michalas, E. Papandreou, George J. Papaioannou

Microelectron. Reliab., 2015

Modelling of the dynamical behaviour of floating electrode MEMS.

Panagiotis Giounanlis, Elena Blokhina, Orla Feely, Loukas Michalas, Matroni Koutsoureli, George J. Papaioannou

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2014

A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches.

Matroni Koutsoureli, Loukas Michalas, Anestis Gantis, George J. Papaioannou

Microelectron. Reliab., 2014

2013

Properties of contactless and contacted charging in MEMS capacitive switches.

Matroni Koutsoureli, Loukas Michalas, P. Martins, E. Papandreou, A. Leuliet, S. Bansropun, George J. Papaioannou, A. Ziaei

Microelectron. Reliab., 2013

2012

A temperature study of photosensitivity in SLS polycrystalline silicon TFTs.

Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas

Microelectron. Reliab., 2012

A study of field emission process in electrostatically actuated MEMS switches.

Loukas Michalas, Anurag Garg, Ayyaswamy Venkattraman, Matroni Koutsoureli, Alina A. Alexeenko, Dimitrios Peroulis, George J. Papaioannou

Microelectron. Reliab., 2012

Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches.

Matroni Koutsoureli, Loukas Michalas, George J. Papaioannou

Microelectron. Reliab., 2012

2010

Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress.

Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas

Microelectron. Reliab., 2010

2007

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.

Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas

Microelectron. Reliab., 2007

2004

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.

Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis

Microelectron. Reliab., 2004