Dimitrios N. Kouvatsos

According to our database1, Dimitrios N. Kouvatsos authored at least 8 papers between 2002 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2010
On the importance of the V<sub>g, max</sub>-V<sub>th</sub> parameter on LTPS TFT stressing behavior.
Microelectron. Reliab., 2010

2008
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
Microelectron. Reliab., 2008

2007
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.
Microelectron. Reliab., 2007

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2007

Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress.
Microelectron. Reliab., 2007

Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2007

2004
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2004

2002
On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors.
Microelectron. Reliab., 2002


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