Argyrios T. Hatzopoulos

According to our database, Argyrios T. Hatzopoulos authored at least 9 papers between 2006 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

A Self-Trained, Low-Complexity Method for Detecting Faults in Analog Circuits.

Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Kyriakos Tsiakmakis, Dimitrios K. Papakostas

IEEE Trans. Instrum. Meas., 2025

Integrated IoT and AI-Driven Smart Refrigerator System.

Dimitrios Toliopoulos, Efthimios Demkas, Argyrios T. Hatzopoulos, Kyriakos Tsiakmakis, Achilles D. Boursianis, Spyridon Nikolaidis, Sotirios K. Goudos, Maria S. Papadopoulou

Proceedings of the 14th International Conference on Modern Circuits and Systems Technologies, 2025

Design and Development of a Low-Cost Circuit for Soil Electrical Conductivity Measurement Using the Wenner Array Method.

Vasileios D. Koufogeorgos, Argyrios T. Hatzopoulos, Kyriakos Tsiakmakis, Vasileios Vassios, Maria S. Papadopoulou, Dimitrios K. Papakostas

Proceedings of the 14th International Conference on Modern Circuits and Systems Technologies, 2025

2024

Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation.

Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Dimitrios K. Papakostas

Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024

Liquid Filling Measuring System with Variable Flow.

Nikisanlis Nikolaos, Argyrios T. Hatzopoulos, Vassilios D. Vassios, Vasileios Delimaras, Kyriakos Tsiakmakis, Maria S. Papadopoulou

Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024

Web-Based Monitoring of Refrigerator Units Using Microcontroller.

Nikolaos Chatzilabrou, Kyriakos Koritsoglou, Aikaterini I. Griva, Vassilios D. Vassios, Kyriakos Tsiakmakis, Achilles D. Boursianis, Argyrios T. Hatzopoulos, Sotirios K. Goudos, Maria S. Papadopoulou

Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024

2008

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.

N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos

Microelectron. Reliab., 2008

2006

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.

Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

Effects of hot carriers in offset gated polysilicon thin-film transistors.

Argyrios T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006