Dimitris K. Papakostas

According to our database, Dimitris K. Papakostas authored at least 14 papers between 1994 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation.

Vassilios D. Vassios, Argirios. T. Hatzopoulos, Dimitrios K. Papakostas

Proceedings of the 12th International Conference on Modern Circuits and Systems Technologies, 2023

2014

Input stimulus comparison using an adaptive FPGA-based testing system.

Sotirios P. Pouros, Vassilios D. Vassios, Dimitrios K. Papakostas, Alkis A. Hatzopoulos

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

2010

Circuit Implementation of a Supply Current Spectrum Test Method.

Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos

IEEE Trans. Instrum. Meas., 2010

Improved analogue fault coverage estimation using probabilistic analysis.

Dimitris K. Papakostas, Alkis A. Hatzopoulos

Int. J. Circuit Theory Appl., 2010

Wavelet analysis of current measurements for mixed-signal circuit testing.

Michael G. Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2008

A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum.

Dimitris K. Papakostas, Alkis A. Hatzopoulos

IEEE Trans. Instrum. Meas., 2008

Power supply current testing in the production line of emergency luminaire circuits.

Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos, Dimitrios K. Konstantinou

Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach.

Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

2007

Multiple Parametric Circuit Analysis Tool for Detectability Estimation.

Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos

Proceedings of the 14th IEEE International Conference on Electronics, 2007

Design and development of a versatile testing system for analog and mixed-signal circuits.

Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Evdokimos I. Konstantinidis, Alexios Spyronasios

Proceedings of the 18th European Conference on Circuit Theory and Design, 2007

2006

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.

Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos

Microelectron. J., 2006

2003

Estimation of circuit output measurements including statistically dependent parameters.

Dimitris K. Papakostas, Alkis A. Hatzopoulos

Int. J. Circuit Theory Appl., 2003

1996

Analog fault detectability based on statistical circuit analysis.

Dimitrios K. Papakostas, V. C. Kosmidis, Alkiviades A. Hatzopoulos

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996

1994

Fault Detection in Linear Bipolar ICs: Comparative Results Between Power Supply Current and Output Voltage Measurements.

Dimitris K. Papakostas, Alkis A. Hatzopoulos

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994