B. Cretu

Orcid: 0000-0002-2727-4605

According to our database1, B. Cretu authored at least 2 papers between 2001 and 2002.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2002
Origin of hot carrier degradation in advanced nMOSFET devices.
Microelectron. Reliab., 2002

2001
Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta<sub>2</sub>O<sub>5</sub> as gate dielectrics.
Microelectron. Reliab., 2001


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