Benjamin N. Lee

According to our database, Benjamin N. Lee authored at least 10 papers between 2005 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Gmail Smart Compose: Real-Time Assisted Writing.

Mia Xu Chen, Benjamin N. Lee, Gagan Bansal, Yuan Cao, Shuyuan Zhang, Justin Lu, Jackie Tsay, Yinan Wang, Andrew M. Dai, Zhifeng Chen, Timothy Sohn, Yonghui Wu

Proceedings of the 25th ACM SIGKDD International Conference on Knowledge Discovery & Data Mining, 2019

2007

Statistical analysis and optimization of parametric delay test.

Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2007 IEEE International Test Conference, 2007

Analyzing the risk of timing modeling based on path delay tests.

Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

A scalable service for photo annotation, sharing, and search.

Benjamin N. Lee, WenYen Chen, Edward Y. Chang

Proceedings of the 14th ACM International Conference on Multimedia, 2006

Fotofiti: web service for photo management.

Benjamin N. Lee, WenYen Chen, Edward Y. Chang

Proceedings of the 14th ACM International Conference on Multimedia, 2006

Fotowiki: distributed map enhancement service.

WenYen Chen, Benjamin N. Lee, Edward Y. Chang

Proceedings of the 14th ACM International Conference on Multimedia, 2006

Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective.

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2006 IEEE International Test Conference, 2006

Refined statistical static timing analysis through.

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 43rd Design Automation Conference, 2006

2005

Reducing Pattern Delay Variations for Screening Frequency Dependent Defects.

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects.

Benjamin N. Lee, Hui Li, Li-C. Wang, Magdy S. Abadir

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005