Bhawani Shankar

According to our database, Bhawani Shankar authored at least 9 papers between 2017 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2025

Reliability Qualification of 1250V Lateral GaN HEMTs for High Reliability Industrial Applications (Invited).

Kamal Varadarajan, Alexei Ankoudinov, Robert Yang, Alexey Kudymov, Bhawani Shankar, Karthick Murukesan, Sorin Georgescu

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

A Hybrid Physical ASM-HEMT Model Using a Neural Network-Based Methodology.

Rafael Perez Martinez, Masaya Iwamoto, Ana M. Banzer Morgado, Yiao Li, Roberto Tinti, Jianjun Xu, Chad Gillease, Steven Cochran, Bhawani Shankar, Else-Marie Schmidt, Zijian Song, Natalie Wagner, Philipp Pahl, Alexander Petr, Srabanti Chowdhury

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2024

2022

Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.

Bhawani Shankar, Zhengliang Bian, Ke Zeng, Chuanzhe Meng, Rafael Perez Martinez, Srabanti Chowdhury, Brendan Gunning, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress.

Bhawani Shankar, Ke Zeng, Brendan Gunning, Rafael Perez Martinez, Chuanzhe Meng, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar, Srabanti Chowdhury

Proceedings of the Device Research Conference, 2022

2019

UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities.

Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs.

Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, Heena Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs.

Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis.

Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava

Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

Face Pose Estimation From Rigid Face Landmarks For Driver Monitoring Systems.

Bhawani Shankar, Dakala Jayachandra, Kalyan Kumar Hati

Proceedings of the Autonomous Vehicles and Machines 2017, Burlingame, CA, USA, January 29, 2017