Mayank Shrivastava

According to our database, Mayank Shrivastava authored at least 34 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2023

Expressive and Efficient Representation Learning for Ranking Links in Temporal Graphs.

Susheel Suresh, Mayank Shrivastava, Arko Mukherjee, Jennifer Neville, Pan Li

Proceedings of the ACM Web Conference 2023, 2023

Max-Quantile Grouped Infinite-Arm Bandits.

Ivan Lau, Yan Hao Ling, Mayank Shrivastava, Jonathan Scarlett

Proceedings of the International Conference on Algorithmic Learning Theory, 2023

2022

CASPR: Customer Activity Sequence-based Prediction and Representation.

Pin-Jung Chen, Sahil Bhatnagar, Sagar Goyal, Damian Konrad Kowalczyk, Mayank Shrivastava

CoRR, 2022

Federated Graph Representation Learning using Self-Supervision.

Susheel Suresh, Danny Godbout, Arko Mukherjee, Mayank Shrivastava, Jennifer Neville, Pan Li

CoRR, 2022

Implications of Various Charge Sources in AlGaN/GaN Epi-Stack on the Drain & Gate Connected Field Plate Design in HEMTs.

Ankit Soni, Mayank Shrivastava

IEEE Access, 2022

Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices.

M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Are Argon and Nitrogen Gases Really Inert to Graphene Devices?

Jeevesh Kumar, Mayank Shrivastava

Proceedings of the Device Research Conference, 2022

2021

A Novel High Voltage Drain Extended FinFET SCR for SoC Applications.

M. Monishmurali, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Peculiar Current Instabilities & Failure Mechanism in Vertically Stacked Nanosheet ggN-FET.

M. Monishmurali, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Threshold Voltage Shift in a-Si: H Thin film Transistors under ESD stress Conditions.

Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs.

M. Monishmurali, Milova Paul, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress.

Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.

Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts.

Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs.

Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel.

Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight.

Jeevesh Kumar, Ansh, Hemanjaneyulu Kuruva, Mayank Shrivastava

Proceedings of the 2020 Device Research Conference, 2020

2019

First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects.

Abhishek Mishra, Adil Meersha, Nagothu Karmel Kranthi, Kruti Trivedi, Harsha B. Variar, N. S. Veenadhari Bellamkonda, Srinivasan Raghavan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior.

Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability.

Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities.

Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes.

Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava

Proceedings of the 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, 2018

Pinot: Realtime OLAP for 530 Million Users.

Jean-François Im, Kishore Gopalakrishna, Subbu Subramaniam, Mayank Shrivastava, Adwait Tumbde, Xiaotian Jiang, Jennifer Dai, Seunghyun Lee, Neha Pawar, Jialiang Li, Ravi Aringunram

Proceedings of the 2018 International Conference on Management of Data, 2018

On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications.

Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs.

Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, H. Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs.

Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability.

Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs.

Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis.

Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava

Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?

Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava

Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET.

Adil Meersha, B. Sathyajit, Mayank Shrivastava

Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

2016

A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package.

Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

2015

Towards predictable and risk-free enterprise systems.

Mayank Shrivastava, Maitreya Natu, Vaishali P. Sadaphal

Proceedings of the 2015 IEEE International Conference on Data Science and Advanced Analytics, 2015

2011

Two-stream indexing for spoken web search.

Jitendra Ajmera, Anupam Joshi, Sougata Mukherjea, Nitendra Rajput, Shrey Sahay, Mayank Shrivastava, Kundan Srivastava

Proceedings of the 20th International Conference on World Wide Web, 2011