C. Larue

According to our database1, C. Larue
  • authored at least 1 paper in 2013.
  • has a "Dijkstra number"2 of six.

Timeline

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Links

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Bibliography

2013
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.
Microelectronics Reliability, 2013


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