Vincent Pouget

According to our database, Vincent Pouget authored at least 33 papers between 2000 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2020

Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects.

Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed

Proceedings of the IEEE Latin-American Test Symposium, 2020

Effect of Temperature on Single Event Latchup Sensitivity.

S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

2019

Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection.

Gennaro Severino Rodrigues, Ádria Barros de Oliveira, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio

J. Electron. Test., 2019

2018

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.

Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget

Microelectron. Reliab., 2018

Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods.

Fabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech

Proceedings of the 31st Symposium on Integrated Circuits and Systems Design, 2018

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection.

Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications.

Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

2017

A calculation method to estimate single event upset cross section.

Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné

Microelectron. Reliab., 2017

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.

Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Microelectron. Reliab., 2017

2013

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.

I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu

Microelectron. Reliab., 2013

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.

Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis

Microelectron. Reliab., 2013

2012

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.

Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

Effects of 1064 nm laser on MOS capacitor.

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

2011

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.

Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2011

2009

Net integrity checking by optical localization techniques.

Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget

Microelectron. Reliab., 2009

Electrical modeling of the effect of beam profile for pulsed laser fault injection.

C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart

Microelectron. Reliab., 2009

2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection.

Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results.

V. Maingot, Jean Baptiste Ferron, Régis Leveugle, Vincent Pouget, Alexandre Douin

Microelectron. Reliab., 2007

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.

Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2006

2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2005

Electrical Modeling for Laser Testing with Different Pulse Durations.

Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

Dynamic behavior of a chemical sensor for humidity level measurement in human breath.

Angie Tetelin, Vincent Pouget, Jean-Luc Lachaud, Claude Pellet

IEEE Trans. Instrum. Meas., 2004

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC.

Vincent Pouget, Dean Lewis, Pascal Fouillat

IEEE Trans. Instrum. Meas., 2004

2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

2002

Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser.

Dean Lewis, Pascal Fouillat, Vincent Pouget

Proceedings of the 3rd Latin American Test Workshop, 2002

2001

Theoretical Investigation of an Equivalent Laser LET.

Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner

Microelectron. Reliab., 2001

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.

Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2001

2000

An Overview of the Applications of a Pulsed Laser System for SEU Testing.

Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000