Frédéric Darracq

According to our database, Frédéric Darracq authored at least 9 papers between 2001 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications.

Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet

IEEE Trans. Circuits Syst. I Regul. Pap., December, 2023

2018

Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors.

Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices.

Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat

Microelectron. Reliab., 2017

2014

A comprehensive study of the application of the EOP techniques on bipolar devices.

Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2014

2013

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.

I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu

Microelectron. Reliab., 2013

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.

Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis

Microelectron. Reliab., 2013

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

2003

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.

Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière

Microelectron. Reliab., 2003

2001

A New Laser System for X-Rays Flashes Sensitivity Evaluation.

Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001