According to our database1, C. Raynaud authored at least 3 papers between 2001 and 2018.
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Measurement and analysis of SiC-MOSFET threshold voltage shift.
Microelectronics Reliability, 2018
Handcrafted features vs ConvNets in 2D echocardiographic images.
Proceedings of the 14th IEEE International Symposium on Biomedical Imaging, 2017
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's.
Microelectronics Reliability, 2001