Carol Q. Tong

According to our database1, Carol Q. Tong authored at least 9 papers between 1990 and 1997.

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Bibliography

1997
Operational and Test Performance in the Presence of Built-in Current Sensors.
VLSI Design, 1997

1995
High level fault modeling of asynchronous circuits.
Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

1994
Resolution Enhancement in I<sub>DDQ</sub> Testing for Large ICs.
VLSI Design, 1994

The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance.
Proceedings of the Seventh International Conference on VLSI Design, 1994

1992
Built-in current self-testing scheme (BICST) for CMOS logic circuits.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

Multiple Fault Detection in CMOS Logic Circuits.
Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992

1991
Enhancement of resolution in supply current based testing for large ICs.
Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

1990
Design of robustly testable static CMOS parity trees derived from binary decision diagrams.
Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, 1990

Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring.
Proceedings of the European Design Automation Conference, 1990


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