Chaowen Yu

According to our database, Chaowen Yu authored at least 5 papers between 2003 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST.

Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

Circuit Independent Weighted Pseudo-Random BIST Pattern Generator.

Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults.

Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

An Improved Markov Source Design for Scan BIST.

Chaowen Yu, Wei Li, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

A scan BIST generation method using a markov source and partial bit-fixing.

Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 40th Design Automation Conference, 2003