D. C. L. (Erik) van Geest

According to our database, D. C. L. (Erik) van Geest authored at least 4 papers between 1999 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

On-Chip Mixed-Signal Test Structures Re-used for Board Test.

Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001

Testing and programming flash memories on assemblies during high volume production.

Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

System-level DFT for consumer products.

D. C. L. (Erik) van Geest, Frans G. M. de Jong

Proceedings of the 6th European Test Workshop, 2001

1999

Computer-aided design of a mass production circuit.

Yu Lin, Say Wei Foo, D. C. L. (Erik) van Geest

Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999