Rodger Schuttert

According to our database, Rodger Schuttert authored at least 5 papers between 1998 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2005

Power-scan chain: design for analog testability.

Amir Zjajo, Henk Jan Bergveld, Rodger Schuttert, José Pineda de Gyvez

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

On-Chip Mixed-Signal Test Structures Re-used for Board Test.

Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002

Improved Test Monitor Circuit in Power Pin DfT.

Rodger Schuttert, Frans G. M. de Jong, Ben Kup

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2000

Power pin testing: making the test coverage complete.

Frans G. M. de Jong, Ben Kup, Rodger Schuttert

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

Testing a multichip package for a consumer communications application.

Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998