Danqun Yu
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Bibliography
  2016
The variation of the leakage current characteristics of W/Ta<sub>2</sub>O<sub>5</sub>/W MIM capacitors with the thickness of the bottom W electrode.
    
  
    Microelectron. Reliab., 2016
    
  
Effects of thermal annealing on the charge localization characteristics of HfO<sub>2</sub>/Au/HfO<sub>2</sub> stack.
    
  
    Microelectron. Reliab., 2016