David T. Miller

According to our database, David T. Miller authored at least 10 papers between 1984 and 1992.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1992

Dynamic redundancy identification in automatic test generation.

Miron Abramovici, David T. Miller, Rabindra K. Roy

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Freeze!: A New Approach for Testing Sequential Circuits.

Miron Abramovici, Krishna B. Rajan, David T. Miller

Proceedings of the 29th Design Automation Conference, 1992

1990

Global cost functions for test generation.

Miron Abramovici, David T. Miller, R. Henning

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989

System-level design verification in the AT&T Computer Division: tools.

Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon

Proceedings of the Computer Design: VLSI in Computers and Processors, 1989

System-level design verification in the AT&T computer division: overview and strategy.

Miron Abramovici, J. W. Bierbauer, R. H. Hellman, C. L. Hong, David T. Miller, R. G. Taylor

Proceedings of the Computer Design: VLSI in Computers and Processors, 1989

1986

Checkpoint Faults are not Sufficient Target Faults for Test Generation.

Miron Abramovici, Prem R. Menon, David T. Miller

IEEE Trans. Computers, 1986

SMART and FAST: Test Generation for VLSI Scan-Design Circuits.

Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller

IEEE Des. Test, 1986

1985

Test Generation In Lamp2: Concepts and Algorithms.

Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller

Proceedings of the Proceedings International Test Conference 1985, 1985

Test Generation In Lamp2: System Overview.

Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Critical Path Tracing: An Alternative to Fault Simulation.

Miron Abramovici, Prem R. Menon, David T. Miller

IEEE Des. Test, 1984