Rabindra K. Roy

According to our database1, Rabindra K. Roy authored at least 39 papers between 1988 and 2000.

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Bibliography

2000
EDA challenges facing future microprocessor design.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

1999
Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits.
J. Electron. Test., 1999

Characterizing Individual Gate Power Sensitivity in Low Power Design.
Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

1998
Activity Measures for Fast Relative Power Estimation in Numerical Transformation for Low Power DSP Synthesis.
J. VLSI Signal Process., 1998

Controller Resynthesis for Testability Enhancement of RTL Controller/Data Path Circuits.
J. Electron. Test., 1998

Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits.
Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

Considering Testability during High-level Design (Embedded Tutorial).
Proceedings of the ASP-DAC '98, 1998

1997
Concurrent Error Detection in Nonlinear Digital Circuits Using Time-Freeze Linearization.
IEEE Trans. Computers, 1997

T5: Low-Power Design.
Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Impact of Partial Reset on Fault Independent Testing and BIST.
Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

1996
Synthesis of initializable asynchronous circuits.
IEEE Trans. Very Large Scale Integr. Syst., 1996

Initialization issues in asynchronous circuit synthesis.
J. Electron. Test., 1996

Synchronous Test Generation Model for Asynchronous Circuits.
Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

1995
Behavioral synthesis of area-efficient testable designs using interaction between hardware sharing and partial scan.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Considering testability at behavioral level: use of transformations for partial scan cost minimization under timing and area constraints.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Guest Editors' Introduction: More Practical Asynchronous Design.
IEEE Des. Test Comput., 1995

Advantages of High-Level Test Synthesis over Design for Test.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

Synthesis-for-testability using transformations.
Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29, 1995

1994
Guest Editor's Introduction: Practical Asynchronous Design.
IEEE Des. Test Comput., 1994

Synthesizing designs with low-cardinality minimum feedback vertex set for partial scan application.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Design for diagnosability of linear digital filters using time-space expansion.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Synthesis of Low Power Linear DSP Circuits Using Activity Metrics.
Proceedings of the Seventh International Conference on VLSI Design, 1994

Initialization Isuues in the Synthesis of Asynchronous Circuits.
Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994

Behavioral synthesis of low-cost partial scan designs for DSP applications.
Proceedings of ICASSP '94: IEEE International Conference on Acoustics, 1994

Signal Transition Graph Transformations for Initializability.
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994

1993
Greedy hardware optimization for linear digital circuits using number splitting and refactorization.
IEEE Trans. Very Large Scale Integr. Syst., 1993

Greedy Hardware Optimization for Linear Digital Systems Using Number Splitting.
Proceedings of the Sixth International Conference on VLSI Design, 1993

Concurrent Error Detection in Nonlinear Digital Circuits with Applications to Adaptive Filters.
Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

Exploiting hardware sharing in high-level synthesis for partial scan optimization.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

An Architectural Transformation Program for Optimization of Digital Systems by Multi-Level Decomposition.
Proceedings of the 30th Design Automation Conference. Dallas, 1993

1992
Test compaction for sequential circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Dynamic redundancy identification in automatic test generation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Delay fault testing of iterative arithmetic arrays.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

Automatic test generation for linear digital systems with bi-level search using matrix transform methods.
Proceedings of the 1992 IEEE/ACM International Conference on Computer-Aided Design, 1992

1991
Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors.
Digit. Signal Process., 1991

The Best Flip-Flops to Scan.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990
Timing verification and synthesis of circuits for delay fault testability
PhD thesis, 1990

1988
Compaction of ATPG-generated test sequences for sequential circuits.
Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988

Fault Simulation in a Distributed Environment.
Proceedings of the 25th ACM/IEEE Conference on Design Automation, 1988


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