Dimitris P. Ioannou

According to our database, Dimitris P. Ioannou authored at least 7 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs.

Dimitris P. Ioannou, Ephrem G. Gebreselasie, Vinh Pham, Uppili S. Raghunathan

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023

2022

Robust Off-State TDDB Reliability of n-LDMOS.

Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Performance Improvements of SiGe HBTs in 90nm BiCMOS Process with fT/fmax of 340/410 GHz.

Uppili S. Raghunathan, Saurabh Sirohi, Vaibhav Ruparelia, Prateek Kumar Sharma, Dimitris P. Ioannou, Vibhor Jain, H. K. Kakara, S. Gedela, Venkat Vanukuru, P. Dongmo, C. Luce, R. Hazbun, R. Krishnasamy, J. Hwang, M. Levy, Kristin Welch, S. Liu, B. Cucci, S. Cole, J. Kantarovsky, A. Vallett, I. McCallum-Cook, M. Yu, R. Phelps, A. Divergilio, A. Sturm, M. Peters, S. Johnson, R. Rassel, M. Lagerquist, M. Kerbaugh, K. Newton, J. Pekarik, Q. Liu

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2021

Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs.

Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam W. DiVergilio, Vibhor Jain, John J. Pekarik

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2020

Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs.

Uppili S. Raghunathan, Pui Yee, Dave Brochu, Vibhor Jain, Harrison P. Lee, John D. Cressler, Dimitris P. Ioannou

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020

2018

Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs.

Dimitris P. Ioannou, Y. Tan, R. Logan, K. Bandy, R. Achanta, P. C. Wang, Dave Brochu, M. Jaffe

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2014

HKMG CMOS technology qualification: The PBTI reliability challenge.

Dimitris P. Ioannou

Microelectron. Reliab., 2014