Doh-Soon Kwak

According to our database1, Doh-Soon Kwak authored at least 3 papers between 2010 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

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Bibliography

2023
Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2012
A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes.
Expert Syst. Appl., 2012

2010
A case study on modeling and optimizing photolithography stage of semiconductor fabrication process.
Qual. Reliab. Eng. Int., 2010


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