Heonsang Lim

According to our database, Heonsang Lim authored at least 2 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations.

Jiyoung Yoon, Bumgi Lee, Jaehee Song, Bokyoung Kang, Sangho Lee, Doh-Soon Kwak, Heonsang Lim, Ilsang Park, Jonghoon Kim, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2015

Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost.

Heonsang Lim

Entropy, 2015