Dong Ni

Orcid: 0000-0002-2227-2555

Affiliations:
  • Zhejiang University, College of Control Science and Engineering, Hangzhou, China


According to our database1, Dong Ni authored at least 13 papers between 2017 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Links

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Bibliography

2024
A method for real-time optimal heliostat aiming strategy generation via deep learning.
Eng. Appl. Artif. Intell., January, 2024

LUM-ViT: Learnable Under-sampling Mask Vision Transformer for Bandwidth Limited Optical Signal Acquisition.
CoRR, 2024

From Denoising Training to Test-Time Adaptation: Enhancing Domain Generalization for Medical Image Segmentation.
Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2024

2023
InstructVideo: Instructing Video Diffusion Models with Human Feedback.
CoRR, 2023

RLIPv2: Fast Scaling of Relational Language-Image Pre-training.
Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023

2022
Synthesized Multi-GFA Multi-bin Wafer Bin Map Dataset.
Dataset, April, 2022

RLIP: Relational Language-Image Pre-training for Human-Object Interaction Detection.
Proceedings of the Advances in Neural Information Processing Systems 35: Annual Conference on Neural Information Processing Systems 2022, 2022

Detecting Human-Object Interactions with Object-Guided Cross-Modal Calibrated Semantics.
Proceedings of the Thirty-Sixth AAAI Conference on Artificial Intelligence, 2022

2021
Spatio-Temporal Dynamic Inference Network for Group Activity Recognition.
Proceedings of the 2021 IEEE/CVF International Conference on Computer Vision, 2021

Learning Visual Context for Group Activity Recognition.
Proceedings of the Thirty-Fifth AAAI Conference on Artificial Intelligence, 2021

2019
Observer and filter design for linear transport-reaction systems.
Eur. J. Control, 2019

2018
Ge CMOS technology with advanced interface and junction engineering.
Proceedings of the 2018 International Conference on IC Design & Technology, 2018

2017
A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits.
Proceedings of the 13th IEEE Conference on Automation Science and Engineering, 2017


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