Douglas Williams

According to our database, Douglas Williams authored at least 9 papers between 1998 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

The Microarchitecture of DOJO, Tesla's Exa-Scale Computer.

Emil Talpes, Debjit Das Sarma, Douglas Williams, Sahil Arora, Thomas Kunjan, Benjamin Floering, Ankit Jalote, Christopher Hsiong, Chandrasekhar Poorna, Vaidehi Samant, John Sicilia, Anantha Kumar Nivarti, Raghuvir Ramachandran, Tim C. Fischer, Ben Herzberg, Bill McGee, Ganesh Venkataramanan, Pete Banon

IEEE Micro, 2023

2022

DOJO: The Microarchitecture of Tesla's Exa-Scale Computer.

Emil Talpes, Douglas Williams, Debjit Das Sarma

Proceedings of the 2022 IEEE Hot Chips 34 Symposium, 2022

2021

Deep Learning and its Application for Healthcare Delivery in Low and Middle Income Countries.

Douglas Williams, Heiko Horst Hornung, Adi Nadimpalli, Ashton Peery

Frontiers Artif. Intell., 2021

2012

Understanding the Relationships Among Various Design Components in a Game-Based Learning Environment.

Yuxin Ma, Douglas Williams, Louise Prejean

Int. J. Gaming Comput. Mediat. Simulations, 2012

2011

An Evidence Based Analytical Approach for Process Automation: Case Study in Finance and Administration Process Delivery Services.

Sai Zeng, Jim Alain Laredo, Sameep Mehta, Himanshu Chauhan, Ashish Verma, Douglas Williams, Beth Browne

Proceedings of the IEEE 8th International Conference on e-Business Engineering, 2011

2007

The design of an analogical encoding tool for game-based virtual learning environments.

Douglas Williams, Yuxin Ma, Steven Feist, Charles E. Richard, Louise Prejean

Br. J. Educ. Technol., 2007

A research agenda for developing and implementing educational computer games.

Yuxin Ma, Douglas Williams, Louise Prejean, Charles E. Richard

Br. J. Educ. Technol., 2007

2006

Where do special issues come from? [from the Editor].

Douglas Williams

IEEE Signal Process. Mag., 2006

1998

A Study on the Utility of Using Expected Quality Level as a Design for Testability Metric.

Douglas Williams, F. Joel Ferguson, Tracy Larrabee

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998