Egas Henes Neto

According to our database1, Egas Henes Neto authored at least 8 papers between 2005 and 2008.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2008
Modeling the sensitivity of CMOS circuits to radiation induced single event transients.
Microelectron. Reliab., 2008

Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors.
J. Electron. Test., 2008

2007
A built-in current sensor for high speed soft errors detection robust to process and temperature variations.
Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, 2007

Using built-in sensors to cope with long duration transient faults in future technologies.
Proceedings of the 2007 IEEE International Test Conference, 2007

2006
Using Bulk Built-in Current Sensors to Detect Soft Errors.
IEEE Micro, 2006

Generation and Propagation of Single Event Transients in CMOS Circuits.
Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005
Single event transients in combinatorial circuits.
Proceedings of the 18th Annual Symposium on Integrated Circuits and Systems Design, 2005

Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic.
Proceedings of the 18th Annual Symposium on Integrated Circuits and Systems Design, 2005


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