Eishi Ibe

According to our database, Eishi Ibe authored at least 4 papers between 2003 and 2012.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2012

Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons.

Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

2006

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling.

Eishi Ibe, S. S. Chung, ShiJie Wen, Hironaru Yamaguchi, Yasuo Yahagi, Hideaki Kameyama, Shigehisa Yamamoto, Takashi Akioka

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

Single Event Effects as a Reliability Issue of IT Infrastructure.

Eishi Ibe, Hideaki Kameyama, Yasuo Yahagi, Hironaru Yamaguchi

Proceedings of the Third International Conference on Information Technology and Applications (ICITA 2005), 2005

2003

16.7-fA/cell tunnel-leakage-suppressed 16-Mb SRAM for handling cosmic-ray-induced multierrors.

Kenichi Osada, Yoshikazu Saitoh, Eishi Ibe, Koichiro Ishibashi

IEEE J. Solid State Circuits, 2003