We stand with Ukraine  

Ephraim Suhir

According to our database1, Ephraim Suhir authored at least 15 papers between 2007 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 1996, "For contributions to the application of mechanical and reliability engineering to physical design and analysis of microelectronic and fiber optic systems".

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2022
Probabilistic Fitts' Law with Application to Spacecraft Collision with an Asteroid.
[BibTeX]
[DOI]
Ephraim Suhir
J. Aerosp. Inf. Syst., October, 2022

2020
Towards Probabilistic Analysis of Human-System Integration in Automated Driving.
[BibTeX]
[DOI]
Ephraim Suhir
,
Gunther Paul
,
Hermann Kaindl
Proceedings of the Intelligent Human Systems Integration 2020, 2020

Extraordinary Automated Driving Situations: Probabilistic Analytical Modeling of Human-Systems-Integration (HSI) and the Role of Trust.
[BibTeX]
[DOI]
Ephraim Suhir
,
Sofia Scataglini
,
Gunther Paul
Proceedings of the Advances in Simulation and Digital Human Modeling, 2020

2016
Predicted thermal stresses in a TSV design.
[BibTeX]
[DOI]
Ephraim Suhir
,
Sung Yi
Proceedings of the 2016 IEEE International 3D Systems Integration Conference, 2016

2015
A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation.
[BibTeX]
[DOI]
A. Bensoussan
,
Ephraim Suhir
,
P. Henderson
,
M. Zahir
Microelectron. Reliab., 2015

Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges.
[BibTeX]
[DOI]
Ephraim Suhir
,
A. Bensoussan
,
Golta Khatibi
,
Johann Nicolics
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models.
[BibTeX]
[DOI]
Ephraim Suhir
Microelectron. Reliab., 2014

Thermal stress in through-silicon-vias: Theory-of-elasticity approach.
[BibTeX]
[DOI]
Ephraim Suhir
Microelectron. Reliab., 2014

Minimizing thermally induced interfacial shearing stress in a thermoelectric module with low fractional area coverage.
[BibTeX]
[DOI]
Amirkoushyar Ziabari
,
Ephraim Suhir
,
Ali Shakouri
Microelectron. J., 2014

2013
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing.
[BibTeX]
[DOI]
Ephraim Suhir
,
Laurent Béchou
Microelectron. Reliab., 2013

Could electronics reliability be predicted, quantified and assured?
[BibTeX]
[DOI]
Ephraim Suhir
Microelectron. Reliab., 2013

2012
When adequate and predictable reliability is imperative.
[BibTeX]
[DOI]
Ephraim Suhir
Microelectron. Reliab., 2012

2010
Elastizitätsmodell eines keramischen Sensorstreifens bei longitudinaler Verformung.
[BibTeX]
[DOI]
Walter Gschohsmann
,
Johann Nicolics
,
Ephraim Suhir
Elektrotech. Informationstechnik, 2010

2008
Portable 2008 - Second ieee international interdisciplinary intersociety conference on pids.
[BibTeX]
[DOI]
Ephraim Suhir
,
Jyrki Joutsensalo
IEEE Veh. Technol. Mag., 2008

2007
Response of a heavy electronic component to harmonic excitations applied to its external electric leads.
[BibTeX]
[DOI]
Ephraim Suhir
Elektrotech. Informationstechnik, 2007


  Loading...