Laurent Béchou

According to our database, Laurent Béchou authored at least 21 papers between 2002 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.

M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten

Microelectron. Reliab., 2018

2017

Practical optical gain by an extended Hakki-Paoli method.

Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou

Microelectron. Reliab., 2017

2015

Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes.

Pamela Del Vecchio, Arnaud Curutchet, Yannick Deshayes, M. Bettiati, F. Laruelle, Nathalie Labat, Laurent Béchou

Microelectron. Reliab., 2015

Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment.

Jérémy Michaud, G. Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby

Microelectron. Reliab., 2015

Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage.

Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou

Microelectron. Reliab., 2015

2013

Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing.

Ephraim Suhir, Laurent Béchou

Microelectron. Reliab., 2013

Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy.

A. Royon, K. Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, Yannick Deshayes

Microelectron. Reliab., 2013

2011

An original DoE-based tool for silicon photodetectors EoL estimation in space environments.

Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi

Microelectron. Reliab., 2011

2010

Strain estimation in III-V materials by analysis of the degree of polarization of luminescence.

Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Béchou

Microelectron. Reliab., 2010

Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses.

Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten

Microelectron. Reliab., 2010

2008

Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.

Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten

Microelectron. Reliab., 2008

Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.

M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul

Microelectron. Reliab., 2008

2006

Use of signal processing imaging for the study of a 3D package in harsh environment.

Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou

Microelectron. Reliab., 2006

2005

Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.

S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto

Microelectron. Reliab., 2005

2004

Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.

Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé

Microelectron. Reliab., 2004

2003

An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy.

Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano

IEEE Trans. Instrum. Meas., 2003

Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.

Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.

Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.

Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto

Microelectron. Reliab., 2003

2002

Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.

B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier

Microelectron. Reliab., 2002

Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).

Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto

Microelectron. Reliab., 2002