Eric Kwang Joo Sim

According to our database, Eric Kwang Joo Sim authored at least 3 papers between 2011 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.

Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan

IEEE Des. Test, 2013

2011

Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.

Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan

IEEE Trans. Instrum. Meas., 2011

Automatic Yield Management System for Semiconductor Production Test.

Huiyuan Cheng, Melanie Po-Leen Ooi, Ye Chow Kuang, Eric Kwang Joo Sim, Bryan Cheah, Serge N. Demidenko

Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011