Serge N. Demidenko

According to our database1, Serge N. Demidenko authored at least 58 papers between 1995 and 2019.

Collaborative distances:

Awards

IEEE Fellow

IEEE Fellow 2004, "For contributions to electronic testing.".

Timeline

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Bibliography

2019
Measurement uncertainty evaluation: Could it help to improve engineering design?
IEEE Instrum. Meas. Mag., 2019

Indoor Visible Light Positioning Using Spring-Relaxation Technique in Real-World Setting.
IEEE Access, 2019

2018
Moment-Constrained Maximum Entropy Method for Expanded Uncertainty Evaluation.
IEEE Access, 2018

2017
Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models.
IEEE Trans. Instrumentation and Measurement, 2017

2016
Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms.
IEEE Trans. Instrumentation and Measurement, 2016

Multivariate alternating decision trees.
Pattern Recognition, 2016

2015
Analytical Standard Uncertainty Evaluation Using Mellin Transform.
IEEE Access, 2015

Eye tracking system to detect driver drowsiness.
Proceedings of the 6th International Conference on Automation, Robotics and Applications, 2015

Vietnamese sign language reader using Intel Creative Senz3D.
Proceedings of the 6th International Conference on Automation, Robotics and Applications, 2015

2014
Standard Uncertainty estimation on polynomial regression models.
Proceedings of the IEEE Sensors Applications Symposium, 2014

Vision inspection system for pharmaceuticals.
Proceedings of the IEEE Sensors Applications Symposium, 2014

2013
Defect cluster recognition system for fabricated semiconductor wafers.
Eng. Appl. of AI, 2013

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.
IEEE Design & Test, 2013

2011
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.
IEEE Trans. Instrumentation and Measurement, 2011

Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests.
IEEE Trans. Instrumentation and Measurement, 2011

Gaussian Process Dynamical Models for hand gesture interpretation in Sign Language.
Pattern Recognition Letters, 2011

Mobile robots in the engineering education setting.
Proceedings of the 5th International Conference on Automation, Robotics and Applications, 2011

An Intelligent Warehouse Stock Management and Tracking System Based on Silicon Identification Technology and 1-Wire Network Communication.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Adaptive Classifier for Robust Detection of Signing Articulators Based on Skin Colour.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Automatic Yield Management System for Semiconductor Production Test.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

2010
Project-Based Learning in Robotics and Electronics in Undergraduate Engineering Program Setting.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Virtual Instrumentation Based IC Parametric Tester for Engineering Education.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2009
Design of embedded differential equation solver.
IJISTA, 2009

Laser and vision sensing for obstacle avoidance and target seeking for a simple mobile robot.
IJISTA, 2009

Robotics competitions in engineering eduction.
Proceedings of the 4th International Conference on Autonomous Robots and Agents, 2009

2008
Isovera digital library.
Proceedings of the ACM/IEEE Joint Conference on Digital Libraries, 2008

Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

2007
Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis.
IEEE Trans. Instrumentation and Measurement, 2007

Saxophone Reed Inspection Employing Planar Electromagnetic Sensors.
IEEE Trans. Instrumentation and Measurement, 2007

Hough Transform Run Length Encoding for Real-Time Image Processing.
IEEE Trans. Instrumentation and Measurement, 2007

2006
A low-cost sensing system for quality monitoring of dairy products.
IEEE Trans. Instrumentation and Measurement, 2006

Master-Slave Control of a Teleoperated Anthropomorphic Robotic Arm With Gripping Force Sensing.
IEEE Trans. Instrumentation and Measurement, 2006

Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.
IEEE Design & Test of Computers, 2006

Wireless Master-Slave Embedded Controller for a Teleoperated Anthropomorphic Robotic Arm with Gripping Force Sensing.
Proceedings of the Fifth International Conference on Networking and the International Conference on Systems (ICN / ICONS / MCL 2006), 2006

Electronic Test Technology Curriculum Revisiting.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

Industry-Academia Collaboration in Undergraduate Test Engineering Unit Development.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

2005
Guest Editorial Special Issue on IMTC'04.
IEEE Trans. Instrumentation and Measurement, 2005

Real-time identification and predictive control of fast mobile robots using global vision sensing.
IEEE Trans. Instrumentation and Measurement, 2005

Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004
Spectral Warping Revisited.
Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003
Analysis and application of digital spectral warping in analog and mixed-signal testing.
IEEE Trans. Reliability, 2003

A contingent of autonomous marching robots: intricacies of system design and motion control.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

2002
Concurrent diagnosis in digital implementations of neural networks.
Neurocomputing, 2002

Making ATE Accessible for Academic Institutions.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Neural Networks to Solve the Problems of Control and Identification.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Harnessing Geographically Distributed Cooperation in Microtechnology Course at Massey University.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Test Chirp Signal Generation Using Spectral Warping.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001
Simulation and Development of Short Transparent Tests for RAM.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000
Guest Editorial.
J. Electronic Testing, 2000

Synthesis of On-Line Testing Control Units: Flow Graph Coding/Monitoring Approach.
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

1999
Accelerating Test Data Processin.
Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998
BIST Module for Mixed-Signal Circuits.
Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

March PS(23N) Test for DRAM Pattern-Sensitive Faults.
Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1996
On-Line Testing In Digital Neural Networks.
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995
Error masking in compact testing based on the Hamming code and its modifications.
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995


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