Serge N. Demidenko

Orcid: 0000-0001-9883-9311

Affiliations:
  • Massey University, Palmerston North, New Zealand


According to our database1, Serge N. Demidenko authored at least 88 papers between 1995 and 2022.

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Bibliography

2022
Experimental Performance Analysis of a Scalable Distributed Hyperledger Fabric for a Large-Scale IoT Testbed.
Sensors, 2022

Machine Learning Techniques for Device-Free Localization Using Low-Resolution Thermopiles.
IEEE Internet Things J., 2022

Mixed-Signal Test System for Education in Instrumentation and Measurement Technology.
Proceedings of the IEEE 9th International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, 2022

2021
Guest Editorial Special Section on Sensors Applications Symposium.
IEEE Trans. Instrum. Meas., 2021

Multi-Layer Blockchain-Based Security Architecture for Internet of Things.
Sensors, 2021

Hyperledger Fabric Blockchain for Securing the Edge Internet of Things.
Sensors, 2021

IoT Big Data provenance scheme using blockchain on Hadoop ecosystem.
J. Big Data, 2021

Device-Free Localization Using Privacy-Preserving Infrared Signatures Acquired From Thermopiles and Machine Learning.
IEEE Access, 2021

Interactive System for Maintenance of Automatic Test Equipment on the IC Production Floor.
Proceedings of the 11th International Conference on Robotics, Vision, Signal Processing and Power Applications, 2021

2020
Watchers on the Wall: Passive Visible Light-Based Positioning and Tracking With Embedded Light-Sensors on the Wall.
IEEE Trans. Instrum. Meas., 2020

Society news: I2MTC 2019.
IEEE Instrum. Meas. Mag., 2020

CapLoc: Capacitive Sensing Floor for Device-Free Localization and Fall Detection.
IEEE Access, 2020

Classifying Cannabis Sativa Flowers, Stems and Leaves using Statistical Machine Learning with Near-Infrared Hyperspectral Reflectance Imaging.
Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020

Signal-to-Noise Ratio Contributors and Effects in Proximal Near-Infrared Spectral Reflectance Measurement on Plant Leaves.
Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020

Logic Built-In Self-Test Instrumentation System for Engineering Test Technology Education.
Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020

2019
Measurement uncertainty evaluation: Could it help to improve engineering design?
IEEE Instrum. Meas. Mag., 2019

Indoor Visible Light Positioning Using Spring-Relaxation Technique in Real-World Setting.
IEEE Access, 2019

Proximal Near-Infrared Spectral Reflectance Characterisation of Weeds Species in New Zealand Pasture.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

Smart Wall: Passive Visible Light Positioning with Ambient Light Only.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

Addressing Emerging Needs of Hi-Tech Industry: Collaborative Engineering Program in Electronic Testing, Instrumentation and Measurement.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

Developing Automatic Markerless Sign Language Gesture Tracking and Recognition System.
Proceedings of the 2019 IEEE International Symposium on Haptic, 2019

2018
Moment-Constrained Maximum Entropy Method for Expanded Uncertainty Evaluation.
IEEE Access, 2018

Towards implementing uncertainty propagation in probabilistic floating-point computation error bounding.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

Application of moment-based measurement uncertainty evaluation to reliability analysis of structural systems.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

Real-time acoustic analysis for flow rate estimation in a medical aerosol application.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017
Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models.
IEEE Trans. Instrum. Meas., 2017

Automatic renal interstitial fibrosis quantification system.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017

Moments and maximum entropy method for expanded uncertainty estimation in measurements.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017

Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017

2016
Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms.
IEEE Trans. Instrum. Meas., 2016

Multivariate alternating decision trees.
Pattern Recognit., 2016

Automating measurement of renal interstitial fibrosis: Effect of colour spaces on quantification.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016

Moment-based measurement uncertainty evaluation for reliability analysis in design optimization.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016

2015
Analytical Standard Uncertainty Evaluation Using Mellin Transform.
IEEE Access, 2015

Eye tracking system to detect driver drowsiness.
Proceedings of the 6th International Conference on Automation, Robotics and Applications, 2015

Vietnamese sign language reader using Intel Creative Senz3D.
Proceedings of the 6th International Conference on Automation, Robotics and Applications, 2015

Performance comparison between expanded uncertainty evaluation algorithms.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

Digital pathology: Identifying spongiosis in unstained histopathology specimen.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

2014
Standard Uncertainty estimation on polynomial regression models.
Proceedings of the IEEE Sensors Applications Symposium, 2014

Vision inspection system for pharmaceuticals.
Proceedings of the IEEE Sensors Applications Symposium, 2014

2013
Defect cluster recognition system for fabricated semiconductor wafers.
Eng. Appl. Artif. Intell., 2013

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.
IEEE Des. Test, 2013

Using the ADTree for feature reduction through knowledge discovery.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

2011
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.
IEEE Trans. Instrum. Meas., 2011

Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests.
IEEE Trans. Instrum. Meas., 2011

Gaussian Process Dynamical Models for hand gesture interpretation in Sign Language.
Pattern Recognit. Lett., 2011

Mobile robots in the engineering education setting.
Proceedings of the 5th International Conference on Automation, Robotics and Applications, 2011

An Intelligent Warehouse Stock Management and Tracking System Based on Silicon Identification Technology and 1-Wire Network Communication.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Adaptive Classifier for Robust Detection of Signing Articulators Based on Skin Colour.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Automatic Yield Management System for Semiconductor Production Test.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

2010
Project-Based Learning in Robotics and Electronics in Undergraduate Engineering Program Setting.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Virtual Instrumentation Based IC Parametric Tester for Engineering Education.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2009
Design of embedded differential equation solver.
Int. J. Intell. Syst. Technol. Appl., 2009

Laser and vision sensing for obstacle avoidance and target seeking for a simple mobile robot.
Int. J. Intell. Syst. Technol. Appl., 2009

Robotics competitions in engineering eduction.
Proceedings of the 4th International Conference on Autonomous Robots and Agents, 2009

2008
Isovera digital library.
Proceedings of the ACM/IEEE Joint Conference on Digital Libraries, 2008

Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

2007
Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis.
IEEE Trans. Instrum. Meas., 2007

Saxophone Reed Inspection Employing Planar Electromagnetic Sensors.
IEEE Trans. Instrum. Meas., 2007

Hough Transform Run Length Encoding for Real-Time Image Processing.
IEEE Trans. Instrum. Meas., 2007

2006
A low-cost sensing system for quality monitoring of dairy products.
IEEE Trans. Instrum. Meas., 2006

Master-Slave Control of a Teleoperated Anthropomorphic Robotic Arm With Gripping Force Sensing.
IEEE Trans. Instrum. Meas., 2006

Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.
IEEE Des. Test Comput., 2006

Wireless Master-Slave Embedded Controller for a Teleoperated Anthropomorphic Robotic Arm with Gripping Force Sensing.
Proceedings of the Fifth International Conference on Networking and the International Conference on Systems (ICN / ICONS / MCL 2006), 2006

Electronic Test Technology Curriculum Revisiting.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

Industry-Academia Collaboration in Undergraduate Test Engineering Unit Development.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

2005
Guest Editorial Special Issue on IMTC'04.
IEEE Trans. Instrum. Meas., 2005

Real-time identification and predictive control of fast mobile robots using global vision sensing.
IEEE Trans. Instrum. Meas., 2005

Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004
Spectral Warping Revisited.
Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003
Analysis and application of digital spectral warping in analog and mixed-signal testing.
IEEE Trans. Reliab., 2003

A contingent of autonomous marching robots: intricacies of system design and motion control.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

2002
Concurrent diagnosis in digital implementations of neural networks.
Neurocomputing, 2002

Making ATE Accessible for Academic Institutions.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Neural Networks to Solve the Problems of Control and Identification.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Harnessing Geographically Distributed Cooperation in Microtechnology Course at Massey University.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Test Chirp Signal Generation Using Spectral Warping.
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

2001
Simulation and Development of Short Transparent Tests for RAM.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000
Guest Editorial.
J. Electron. Test., 2000

Synthesis of On-Line Testing Control Units: Flow Graph Coding/Monitoring Approach.
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

1999
Accelerating Test Data Processin.
Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998
BIST Module for Mixed-Signal Circuits.
Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

March PS(23N) Test for DRAM Pattern-Sensitive Faults.
Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1996
On-Line Testing In Digital Neural Networks.
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995
Error masking in compact testing based on the Hamming code and its modifications.
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995


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