Melanie Po-Leen Ooi

According to our database1, Melanie Po-Leen Ooi authored at least 29 papers between 2005 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2018
The past and future of electronics testing [Trends in Future I&M].
IEEE Instrum. Meas. Mag., 2018

Automated quantification of renal interstitial fibrosis for computer-aided diagnosis: A comprehensive tissue structure segmentation method.
Computer Methods and Programs in Biomedicine, 2018

Moment-Constrained Maximum Entropy Method for Expanded Uncertainty Evaluation.
IEEE Access, 2018

2017
Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models.
IEEE Trans. Instrumentation and Measurement, 2017

2016
Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms.
IEEE Trans. Instrumentation and Measurement, 2016

Multivariate alternating decision trees.
Pattern Recognition, 2016

Among the challenges and future trends in I&M [Future Trends in I&M].
IEEE Instrum. Meas. Mag., 2016

Outstanding young engineer of the year award 2014 [Society News].
IEEE Instrum. Meas. Mag., 2016

2015
Sparse alternating decision tree.
Pattern Recognition Letters, 2015

Analytical Standard Uncertainty Evaluation Using Mellin Transform.
IEEE Access, 2015

2013
Defect cluster recognition system for fabricated semiconductor wafers.
Eng. Appl. of AI, 2013

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.
IEEE Design & Test, 2013

2012
Multisine With Optimal Phase-Plane Uniformity for ADC Testing.
IEEE Trans. Instrumentation and Measurement, 2012

Statistical measures of two dimensional point set uniformity.
Computational Statistics & Data Analysis, 2012

2011
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.
IEEE Trans. Instrumentation and Measurement, 2011

Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests.
IEEE Trans. Instrumentation and Measurement, 2011

Performance Comparison of Various Multisine Excitation Signals in ADC Testing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

Automatic Yield Management System for Semiconductor Production Test.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011

2010
Complex feature alternating decision tree.
IJISTA, 2010

Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Virtual Instrumentation Based IC Parametric Tester for Engineering Education.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2009
Design of embedded differential equation solver.
IJISTA, 2009

2008
Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

2007
Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis.
IEEE Trans. Instrumentation and Measurement, 2007

2006
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.
IEEE Design & Test of Computers, 2006

Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

2005
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005


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