Melanie Po-Leen Ooi
According to our database1,
Melanie Po-Leen Ooi
authored at least 32 papers
between 2005 and 2019.
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Bibliography
2019
Measurement uncertainty evaluation: Could it help to improve engineering design?
IEEE Instrum. Meas. Mag., 2019
Future trend in I&M: The smarter car.
IEEE Instrum. Meas. Mag., 2019
2018
The past and future of electronics testing [Trends in Future I&M].
IEEE Instrum. Meas. Mag., 2018
The fourth industrial revolution - Industry 4.0 and IoT [Trends in Future I&M].
IEEE Instrum. Meas. Mag., 2018
Automated quantification of renal interstitial fibrosis for computer-aided diagnosis: A comprehensive tissue structure segmentation method.
Computer Methods and Programs in Biomedicine, 2018
Moment-Constrained Maximum Entropy Method for Expanded Uncertainty Evaluation.
IEEE Access, 2018
2017
Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models.
IEEE Trans. Instrumentation and Measurement, 2017
2016
Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms.
IEEE Trans. Instrumentation and Measurement, 2016
Multivariate alternating decision trees.
Pattern Recognition, 2016
Among the challenges and future trends in I&M [Future Trends in I&M].
IEEE Instrum. Meas. Mag., 2016
Outstanding young engineer of the year award 2014 [Society News].
IEEE Instrum. Meas. Mag., 2016
2015
Sparse alternating decision tree.
Pattern Recognition Letters, 2015
Analytical Standard Uncertainty Evaluation Using Mellin Transform.
IEEE Access, 2015
2013
Defect cluster recognition system for fabricated semiconductor wafers.
Eng. Appl. of AI, 2013
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.
IEEE Design & Test, 2013
2012
Multisine With Optimal Phase-Plane Uniformity for ADC Testing.
IEEE Trans. Instrumentation and Measurement, 2012
Statistical measures of two dimensional point set uniformity.
Computational Statistics & Data Analysis, 2012
2011
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.
IEEE Trans. Instrumentation and Measurement, 2011
Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests.
IEEE Trans. Instrumentation and Measurement, 2011
Performance Comparison of Various Multisine Excitation Signals in ADC Testing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
Automatic Yield Management System for Semiconductor Production Test.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
2010
Complex feature alternating decision tree.
IJISTA, 2010
Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Virtual Instrumentation Based IC Parametric Tester for Engineering Education.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
2009
Design of embedded differential equation solver.
IJISTA, 2009
2008
Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008
2007
Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis.
IEEE Trans. Instrumentation and Measurement, 2007
2006
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.
IEEE Design & Test of Computers, 2006
Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006
2005
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005