Frank Bouwman

According to our database, Frank Bouwman authored at least 4 papers between 1992 and 2001.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2001

Test and debug strategy of the PNX8525 Nexperia^TM digital video platform system chip.

Bart Vermeulen, Steven Oostdijk, Frank Bouwman

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1994

Application of Joint Time-Frequency Analysis in Mixed-Signal Testing.

Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Minimizing Test Time by Exploiting Parallelism in Macro Test.

Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Macro Testability: The Results of Production Device Applications.

Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992