Gab-soo Han

According to our database, Gab-soo Han authored at least 3 papers between 2004 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2014

7.1 A 1/4-inch 8Mpixel CMOS image sensor with 3D backside-illuminated 1.12μm pixel with front-side deep-trench isolation and vertical transfer gate.

JungChak Ahn, Kyungho Lee, Yitae Kim, Heegeun Jeong, Bumsuk Kim, Hongki Kim, Jongeun Park, Taesub Jung, Wonje Park, Taeheon Lee, Eunkyung Park, Sangjun Choi, Gyehun Choi, Haeyong Park, Yujung Choi, Seungwook Lee, Yunkyung Kim, Y. J. Jung, Donghyuk Park, Seungjoo Nah, Youngsun Oh, Mihye Kim, Yooseung Lee, Youngwoo Chung, Ihara Hisanori, Joon-Hyuk Im, Daniel-K J Lee, Byunghyun Yim, GiDoo Lee, Heesang Kown, Sungho Choi, Jeonsook Lee, Dongyoung Jang, Youngchan Kim, Tae Chan Kim, Hiroshige Goto, Chi-Young Choi, Duckhyung Lee, Gab-soo Han

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2012

A 14b extended counting ADC implemented in a 24Mpixel APS-C CMOS image sensor.

Jae-Hong Kim, Wun-ki Jung, Seung-hyun Lim, Yu-jin Park, Won-Ho Choi, Yun-Jung Kim, Chang-eun Kang, Jihun Shin, Kyojin Choo, Won-baek Lee, Jin-kyeong Heo, Byung-jo Kim, Se-jun Kim, Min-ho Kwon, Kwi-sung Yoo, Jin-Ho Seo, Seog-heon Ham, Chi-Young Choi, Gab-soo Han

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012

2004

A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence.

Yong-Ha Song, Choong-Kyun Kim, Moo-Young Park, Bum-Suk Kye, Jeongil Seo, Dong-Soo Cho, Taek-Soo Kim, Gab-soo Han

Microelectron. Reliab., 2004