Gábor Gyepes

According to our database, Gábor Gyepes authored at least 10 papers between 2011 and 2022.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2022

Intelligent Monitoring System for Universal Data Collection and Analysis.

Ondrej Kachman, Jakub Findura, Marcel Baláz, Gábor Gyepes, Libor Majer, Marian Vojs

Proceedings of the 32nd International Conference Radioelektronika, 2022

2014

BIST architecture for oscillation test of analog ICs and investigation of test hardware influence.

Daniel Arbet, Viera Stopjaková, Juraj Brenkus, Gábor Gyepes, Martin Kovác, Libor Majer

Microelectron. Reliab., 2014

A new I_DDT test approach and its efficiency in covering resistive opens in SRAM arrays.

Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus

Microprocess. Microsystems, 2014

A novel impedance calculation method and its time efficiency evaluation.

Juraj Brenkus, Viera Stopjaková, Daniel Arbet, Gábor Gyepes, Libor Majer

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

2013

Numerical method for DC fault analysis simplification and simulation time reduction.

Juraj Brenkus, Viera Stopjaková, Gábor Gyepes

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

Efficiency of oscillation-based BIST in 90nm CMOS active analog filters.

Daniel Arbet, Gabriel Nagy, Viera Stopjaková, Gábor Gyepes

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Application of IDDT test towards increasing SRAM reliability in nanometer technologies.

Gábor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjaková

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters.

Daniel Arbet, Gábor Gyepes, Juraj Brenkus, Viera Stopjaková

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies.

Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Increasing the efficiency of analog OBIST using on-chip compensation of technology variations.

Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011