Gennady Gildenblat

According to our database1, Gennady Gildenblat authored at least 15 papers between 1991 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 2010, "For contributions to modeling of metal-oxide semiconductor field effect transistors".

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2010
Statistical Modeling With the PSP MOSFET Model.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Extensions to Backward Propagation of Variance for Statistical Modeling.
IEEE Des. Test Comput., 2010

2009
Guest Editorial Special Section on 2008 IEEE Custom Integrated Circuits Conference.
IEEE Trans. Circuits Syst. I Regul. Pap., 2009

The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications.
IEEE J. Solid State Circuits, 2009

Modeling of passive elements and reliability.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

2008
Session 11 - Compact modeling.
Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007
PSP-SOI: A Surface Potential Based Compact Model of Partially Depleted SOI MOSFETs.
Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

PSP-Based Scalable MOS Varactor Model.
Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2005
SP-SOI: a third generation surface potential based compact SOI MOSFET Model.
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

Unified non-quasi-static MOSFET model for large-signal and small-signal simulations.
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004
SP: an advanced surface-potential-based compact MOSFET model.
IEEE J. Solid State Circuits, 2004

Advanced compact models: gateway to modern CMOS design.
Proceedings of the 2004 11th IEEE International Conference on Electronics, 2004

A robust large signal non-quasi-static MOSFET model for circuit simulation.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

RF distortion analysis with compact MOSFET models.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

1991
N-channel MOSFET model for the 60-300-K temperature range.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991


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