H. Jaouen

According to our database, H. Jaouen authored at least 2 papers in 2007.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2007

FEM-based method to determine mechanical stress evolution during process flow in microelectronics, application to stress-voiding.

S. Orain, J.-C. Barbé, X. Federspiel, P. Legallo, H. Jaouen

Microelectron. Reliab., 2007

A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and STI in MOS technologies.

Florian Cacho, S. Orain, G. Cailletaud, H. Jaouen

Microelectron. Reliab., 2007