Florian Cacho

According to our database, Florian Cacho authored at least 47 papers between 2007 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation.

Joycelyn Hai, Florian Cacho, X. Federspiel, Tidjani Garba-Seybou, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications.

Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging.

Yunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

2022

Design-Time Exploration for Process, Environment and Aging Compensation Techniques for Low Power Reliable-Aware Design.

Lorena Anghel, Florian Cacho

IEEE Trans. Emerg. Top. Comput., 2022

40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode.

Kedar Janardan Dhori, Promod Kumar, Christophe Lecocq, Pascal Urard, Olivier Callen, Florian Cacho, Maryline Parra, Prashant Pandey, Daniel Noblet

Proceedings of the 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, 2022

Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications.

Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros

Proceedings of the IEEE International Reliability Physics Symposium, 2022

New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes.

Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Frequency dependant gate oxide TDDB model.

M. Arabi, X. Federspiel, Florian Cacho, M. Rafik, S. Blonkowski, Xavier Garros, G. Guibaudo

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations.

Louis Gerrer, Jacques Cluzel, Fred Gaillard, Xavier Garros, Xavier Federspiel, Florian Cacho, David Roy, E. Vincent

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling.

Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho

Proceedings of the IEEE International Reliability Physics Symposium, 2021

HCI Temperature sense effect from 180nm to 28nm nodes.

Xavier Federspiel, Abdourahmane Camara, Audrey Michard, Cheikh Diouf, Florian Cacho

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Monitoring Setup and Hold Timing Limits.

Florian Cacho, Lorena Anghel, Xavier Federspiel

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Comparison of variability of HCI induced drift for SiON and HKMG devices.

Xavier Federspiel, Cheikh Diouf, Florian Cacho, Emmanuel Vincent

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS.

Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology.

A. P. Nguyen, Xavier Garros, M. Rafik, Florian Cacho, David Roy, Xavier Federspiel, Fred Gaillard

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement.

Florian Cacho, X. Federspiel, D. Nouguier, Cheikh Diouf

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Global and Local Process Variation Simulations in Design for Reliability approach.

Audrey Michard, Florian Cacho, Damien Celeste, Xavier Federspiel

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018

Investigation of speed sensors accuracy for process and aging compensation.

Riddhi Jitendrakumar Shah, Florian Cacho, Vincent Huard, Souhir Mhira, D. Arora, Pankaj Agarwal, Shubham Kumar, S. Balaraman, Bijoy Kumar Singh, Lorena Anghel

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability assessment of 4GSP/s interleaved SAR ADC.

Rania Lajmi, Florian Cacho, O. David, Jean-Pierre Blanc, Emmanuel Rouat, Sébastien Haendler, Ph. Benech, Estelle Lauga-Larroze, Sylvain Bourdel

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Integrated Test Structures for Reliability Investigation under Dynamic Stimuli.

Florian Cacho, D. Nouguier, M. Arabi, X. Federspiel, Y. Carminati, M. Saliva

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI.

Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Characterization of Low Drop-Out during ageing and design for yield.

R. Lajmi, Florian Cacho, Estelle Lauga-Larroze, Sylvain Bourdel, Ph. Benech, Vincent Huard, X. Federspiel

Microelectron. Reliab., 2017

Enabling robust automotive electronic components in advanced CMOS nodes.

Vincent Huard, Souhir Mhira, Florian Cacho, Alain Bravaix

Microelectron. Reliab., 2017

Cognitive approach to support dynamic aging compensation.

Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix

Proceedings of the IEEE International Test Conference, 2017

Dynamic aging compensation and Safety measures in Automotive environment.

Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Investigation of critical path selection for in-situ monitors insertion.

Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

High-yield design of high-density SRAM for low-voltage and low-leakage operations.

Kedar Janardan Dhori, Hitesh Chawla, Ashish Kumar, Prashant Pandey, Promod Kumar, Lorenzo Ciampolini, Florian Cacho, Damien Croain

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

Workload dependent reliability timing analysis flow.

Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Souhir Mhira, Florian Cacho, Lorena Anghel

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes.

Cheikh Ndiaye, Vincent Huard, X. Federspiel, Florian Cacho, Alain Bravaix

Microelectron. Reliab., 2016

Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.

Alain Bravaix, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Vincent Huard

Microelectron. Reliab., 2016

Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results.

Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

28nm FDSOI technology sub-0.6V SRAM Vmin assessment for ultra low voltage applications.

Rossella Ranica, Nicolas Planes, Vincent Huard, Olivier Weber, Daniel Noblet, Damien Croain, Fabien Giner, Sylvie Naudet, P. Mergault, S. Ibars, A. Villaret, Maryline Parra, Sébastien Haendler, M. Quoirin, Florian Cacho, C. Julien, F. Terrier, Lorenzo Ciampolini, David Turgis, Christophe Lecocq, Franck Arnaud

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability.

Ahmed Benhassain, Souhir Mhira, Florian Cacho, Vincent Huard, Lorena Anghel

Proceedings of the 1st IEEE International Verification and Security Workshop, 2016

Activity profiling: Review of different solutions to develop reliable and performant design.

Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes.

Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.

Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

Study of workload impact on BTI HCI induced aging of digital circuits.

Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Early failure prediction by using in-situ monitors: Implementation and application results.

Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

2015

Impact of gate oxide breakdown in logic gates from 28nm FDSOI CMOS technology.

M. Saliva, Florian Cacho, Cheikh Ndiaye, Vincent Huard, D. Angot, Alain Bravaix, Lorena Anghel

Proceedings of the IEEE International Reliability Physics Symposium, 2015

28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation.

P. Mora, X. Federspiel, Florian Cacho, Vincent Huard, Wafa Arfaoui

Proceedings of the IEEE International Reliability Physics Symposium, 2015

From BTI variability to product failure rate: A technology scaling perspective.

Vincent Huard, D. Angot, Florian Cacho

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.

M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

Timing in-situ monitors: Implementation strategy and applications results.

Ahmed Benhassain, Florian Cacho, Vincent Huard, M. Saliva, Lorena Anghel, C. R. Parthasarathy, Abhishek Jain, Fabien Giner

Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015

2012

Reliability Characterization and Modeling Solution to Predict Aging of 40-nm MOSFET DC and RF Performances Induced by RF Stresses.

Laurent Negre, David Roy, Florian Cacho, Patrick Scheer, Sebastien Jan, Samuel Boret, Daniel Gloria, Gérard Ghibaudo

IEEE J. Solid State Circuits, 2012

2011

A bottom-up approach for System-On-Chip reliability.

Vincent Huard, N. Ruiz Amador, Florian Cacho, E. Pion

Microelectron. Reliab., 2011

Bottom-up digital system-level reliability modeling.

N. Ruiz Amador, Vincent Huard, E. Pion, Florian Cacho, Damien Croain, V. Robert, Sylvain Engels, Philippe Flatresse, Lorena Anghel

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2007

A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and STI in MOS technologies.

Florian Cacho, S. Orain, G. Cailletaud, H. Jaouen

Microelectron. Reliab., 2007