S. Orain

According to our database1, S. Orain authored at least 2 papers in 2007.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2007
FEM-based method to determine mechanical stress evolution during process flow in microelectronics, application to stress-voiding.
Microelectron. Reliab., 2007

A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and STI in MOS technologies.
Microelectron. Reliab., 2007


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