Hérvé Fleury

According to our database, Hérvé Fleury authored at least 4 papers between 2000 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

High throughput non-contact SiP testing.

Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky

Proceedings of the 2007 IEEE International Test Conference, 2007

2004

Electronic circuit comprising a secret sub-module.

Hérvé Fleury

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001

Enhanced reduced pin-count test for full-scan design.

Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Inserting Scan at the Behavioral Level.

Chouki Aktouf, Hérvé Fleury, Chantal Robach

IEEE Des. Test Comput., 2000