Hérvé Fleury

According to our database1, Hérvé Fleury authored at least 4 papers between 2000 and 2007.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2007
High throughput non-contact SiP testing.
Proceedings of the 2007 IEEE International Test Conference, 2007

2004
Electronic circuit comprising a secret sub-module.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001
Enhanced reduced pin-count test for full-scan design.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000
Inserting Scan at the Behavioral Level.
IEEE Des. Test Comput., 2000


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