Hideya Matsuyama

According to our database, Hideya Matsuyama authored at least 5 papers between 2011 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Verification of Copper Stress Migration Under Low Temperature Long Time Stress.

Hideya Matsuyama, Takashi Suzuki, Motoki Shiozu, Hideo Ehara, Takeshi Soeda, Hirokazu Hosoi, Masao Oshima, Kikuo Yamabe

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2015

Soft error immune latch design for 20 nm bulk CMOS.

Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Impact of package on neutron induced single event upset in 20 nm SRAM.

Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Critical charge dependence of correlation of different neutron sources for soft error testing.

Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin-ichiro Abe, Yukinobu Watanabe

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2011

Investigation of multi cell upset in sequential logic and validity of redundancy technique.

Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011