Hiroyuki Michinishi

According to our database, Hiroyuki Michinishi authored at least 9 papers between 1995 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Detection of CMOS Open Node Defects by Frequency Analysis.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

IEICE Trans. Inf. Syst., 2007

2004

Model analysis of coronary hemodynamics incorporating autoregulation.

Mitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya

Syst. Comput. Jpn., 2004

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

IEICE Trans. Inf. Syst., 2004

2003

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002

CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

1997

Testing for the programming circuit of LUT-based FPGAs.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

A Test Methodology for Interconnect Structures of LUT-based FPGAs.

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs.

Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto

IEICE Trans. Inf. Syst., 1995

Universal test complexity of field-programmable gate arrays.

Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995