Hui-Chuan Chao
According to our database1,
Hui-Chuan Chao
authored at least 2 papers
between 2008 and 2014.
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Bibliography
2014
Development and empirical verification of an accuracy model for the power down leakage tests.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
2008
Proceedings of the 2008 IEEE International Test Conference, 2008