Friedrich Taenzler

According to our database, Friedrich Taenzler authored at least 16 papers between 1993 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2014

Development and empirical verification of an accuracy model for the power down leakage tests.

Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

A novel BIST technique for LDMOS drivers.

Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2013

Physics-Based Low-Cost Test Technique for High Voltage LDMOS.

Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi

J. Electron. Test., 2013

Physics Based Fault Models for Testing High-Voltage LDMOS.

Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

2012

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.

Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.

Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force

J. Electron. Test., 2011

2010

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems.

Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler

IEEE Des. Test Comput., 2010

Low cost test and tuning of RF circuits and systems.

Abhijit Chatterjee, Friedrich Taenzler

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

RADPro: Automatic RF analyzer and diagnostic program generation tool.

Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed

Proceedings of the 2011 IEEE International Test Conference, 2010

2008

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers.

Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee

IEEE Des. Test Comput., 2008

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms.

Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler

Proceedings of the 2008 IEEE International Test Conference, 2008

Optimized EVM Testing for IEEE 802.11a/n RF ICs.

Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Production Test of High Volume Commercial RFIC.

Friedrich Taenzler

Proceedings of the 16th Asian Test Symposium, 2007

2006

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.

Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.

Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

1993

Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing.

Friedrich Taenzler, Thomas Novak, Erich Kubalek

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993