Sule Ozev

IEEE Des. Test, August, 2023

IMPRoVED: Integrated Method to Predict PostRouting setup Violations in Early Design Stages.

[BibT_eX]

[DOI]

Suhas Krishna Kashyap

ACM Trans. Design Autom. Electr. Syst., July, 2023

A Low Cost Physical Stimulus Emulator for Motion and Pressure Sensors.

[BibT_eX]

[DOI]

Ishaan Bassi

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2023

Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors.

[BibT_eX]

[DOI]

Ferhat Can Ataman

Mohammed Aladsani

Georgios C. Trichopoulos

Y. B. Chethan Kumar

Proceedings of the IEEE European Test Symposium, 2023

Global Tuning for System Performance Optimization of RF MIMO Radars.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2023

2022

An In-Field Programmable Adaptive CMOS LNA for Intelligent IoT Sensor Node Applications.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Digital Fault-based Built-in Self-test and Evaluation of Low Dropout Voltage Regulators.

[BibT_eX]

[DOI]

ACM J. Emerg. Technol. Comput. Syst., 2022

Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Fast RF Mismatch Calibration Using Built-in Detectors.

[BibT_eX]

[DOI]

Muslum Emir Avci

Y. B. Chethan Kumar

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Detecting Anomaly in Chemical Sensors via Regularized Contrastive Learning.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Acoustics, 2022

Guaranteed Activation of Capacitive Trojan Triggers During Post Production Test via Supply Pulsing.

[BibT_eX]

[DOI]

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2021

Malicious Activity Detection in Lightweight Wearable and IoT Devices Using Signal Stitching.

[BibT_eX]

[DOI]

Sensors, 2021

Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration.

[BibT_eX]

[DOI]

Ishaan Bassi

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Background Receiver IQ Imbalance Correction for in-Field and Post-Production Testing and Calibration.

[BibT_eX]

[DOI]

Muslum Emir Avci

Proceedings of the IEEE International Test Conference, 2021

Discrete Cosine Transform Based Causal Convolutional Neural Network for Drift Compensation in Chemical Sensors.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Acoustics, 2021

2020

In-Field Recovery of RF Circuits from Wearout Based Performance Degradation.

[BibT_eX]

[DOI]

IEEE Trans. Emerg. Top. Comput., 2020

A Reconfigurable 0.1-10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers.

[BibT_eX]

[DOI]

Osman Emir Erol

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Energy-Efficient Image Recognition System for Marine Life.

[BibT_eX]

[DOI]

H. Seckin Demir

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Self-Powered Wearable IoT Devices for Health and Activity Monitoring.

[BibT_eX]

[DOI]

Found. Trends Electron. Des. Autom., 2020

Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead.

[BibT_eX]

[DOI]

IEEE Des. Test, 2020

Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test.

[BibT_eX]

[DOI]

Debatrayee Roychowdhury

Soroush Moallemi

Proceedings of the 2020 IEEE Radio and Wireless Symposium, 2020

Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments.

[BibT_eX]

[DOI]

Agamyrat Agambayev

Christopher Lue Sang

Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections.

[BibT_eX]

[DOI]

Muslum Emir Avci

Proceedings of the IEEE International Test Conference, 2020

A Crowd-Based Explosive Detection System with Two-Level Feedback Sensor Calibration.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2020

2019

Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2019

Knowledge- and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications.

[BibT_eX]

[DOI]

Osman Emir Erol

ACM Trans. Design Autom. Electr. Syst., 2019

Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas.

[BibT_eX]

[DOI]

J. Electron. Test., 2019

On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration.

[BibT_eX]

[DOI]

IEEE Des. Test, 2019

Detecting Gas Vapor Leaks Using Uncalibrated Sensors.

[BibT_eX]

[DOI]

IEEE Access, 2019

PCB Hardware Trojans: Attack Modes and Detection Strategies.

[BibT_eX]

[DOI]

Matthew McGuire

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Optimized Stress Testing for Flexible Hybrid Electronics Designs.

[BibT_eX]

[DOI]

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Detecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS.

[BibT_eX]

[DOI]

Diaa Badawi

Chengmo Yang

A. Enis Çetin

Proceedings of the IEEE International Conference on Acoustics, 2019

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2018

Remote Detection of Unauthorized Activity via Spectral Analysis.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2018

Detection Mechanisms for Unauthorized Wireless Transmissions.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2018

Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques.

[BibT_eX]

[DOI]

Navankur Beohar

Venkata N. K. Malladi

Debashis Mandal

Bertan Bakkaloglu

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Special session on BIST/calibration of A/MS devices.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

A built-in self-test technique for transmitter-only systems.

[BibT_eX]

[DOI]

Jennifer N. Kitchen

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Online information utility assessment for per-device adaptive test flow.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

RF circuit authentication for detection of process Trojans.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Enabling fast process variation and fault simulation through macromodelling of analog components.

[BibT_eX]

[DOI]

Proceedings of the 27th IEEE North Atlantic Test Workshop, 2018

2017

A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2017

Adaptive Reduction of the Frequency Search Space for Multi-V<sub>dd</sub> Digital Circuits Using Variation Sensitive Ring Oscillators.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Statistical library characterization using arbitrary polynomial chaos.

[BibT_eX]

[DOI]

Sarma B. K. Vrudhula

Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017

Built-in self-test for stability measurement of low dropout regulator.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2017

Evaluation of loop transfer function based dynamic testing of LDOs.

[BibT_eX]

[DOI]

Proceedings of the International Test Conference in Asia, 2017

Receiver echo cancellation with real-time self calibration for passive implanted neuron recorders.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

Contact-less near-field measurement of RF phased array antenna mismatches.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE European Test Symposium, 2017

Remote detection of unauthorized activity via spectral analysis: work-in-progress.

[BibT_eX]

[DOI]

Proceedings of the Twelfth IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis Companion, 2017

2016

A Comparator-Based Rail Clamp.

[BibT_eX]

[DOI]

Kent Oertle

IEEE Trans. Very Large Scale Integr. Syst., 2016

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2016

Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2016

Process Independent Design Methodology for the Active RC and Single-Inverter-Based Rail Clamp.

[BibT_eX]

[DOI]

Robert Elio

ACM Trans. Design Autom. Electr. Syst., 2016

Adapting to Varying Distribution of Unknown Response Bits.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2016

Rail Clamp with Dynamic Time-Constant Adjustment.

[BibT_eX]

[DOI]

Kent Oertle

IEEE J. Solid State Circuits, 2016

Process independent gain measurement with low overhead via BIST/DUT co-design.

[BibT_eX]

[DOI]

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Making unreliable Chem-FET sensors smart via soft calibration.

[BibT_eX]

[DOI]

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

Detection of malicious hardware components in mobile platforms.

[BibT_eX]

[DOI]

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

Post-production adaptation of RF circuits for application-specific performance metrics.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Multi-objective design optimization for flexible hybrid electronics.

[BibT_eX]

[DOI]

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

2015

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2015

Adaptive Generation of Unique IDs for Digital Chips through Analog Excitation.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2015

Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation.

[BibT_eX]

[DOI]

IEEE Des. Test, 2015

Panel: Analog/RF BIST: Are we there yet?

[BibT_eX]

[DOI]

Linda Milor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance.

[BibT_eX]

[DOI]

Bertan Bakkaloglu

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Disturbance-free BIST for loop characterization of DC-DC buck converters.

[BibT_eX]

[DOI]

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

A self-compensating built-in self-test solution for RF phased array mismatch.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

Robust amplitude measurement for RF BIST applications.

[BibT_eX]

[DOI]

Lakshmanan Balasubramanian

Proceedings of the 20th IEEE European Test Symposium, 2015

On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC.

[BibT_eX]

[DOI]

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Built-In EVM Measurement With Negligible Hardware Overhead.

[BibT_eX]

[DOI]

IEEE Des. Test, 2014

Special session 4B: Panel: Testing and calibration for power management circuits.

[BibT_eX]

[DOI]

Bertan Bakkaloglu

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Development and empirical verification of an accuracy model for the power down leakage tests.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Reliability enhancement using in-field monitoring and recovery for RF circuits.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Approximating the age of RF/analog circuits through re-characterization and statistical estimation.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2013

Efficient Process Shift Detection and Test Realignment.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters.

[BibT_eX]

[DOI]

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Zero-overhead self test and calibration of RF transceivers.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Adaptive quality binning for analog circuits.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE European Test Symposium, 2013

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion.

[BibT_eX]

[DOI]

Mustapha Slamani

Proceedings of the 18th IEEE European Test Symposium, 2013

Fault analysis and simulation of large scale industrial mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2013

Adaptive reduction of the frequency search space for multi-vdd digital circuits.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2013

Electrical calibration of spring-mass MEMS capacitive accelerometers.

[BibT_eX]

[DOI]

Lingfei Deng

Vinay Kundur

Naveen Sai Jangala Naga

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Test Application for Analog/RF Circuits With Low Computational Burden.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector.

[BibT_eX]

[DOI]

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Adaptive testing: Conquering process variations.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE European Test Symposium, 2012

Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE European Test Symposium, 2012

Adaptive testing of chips with varying distributions of unknown response bits.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE European Test Symposium, 2012

An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode.

[BibT_eX]

[DOI]

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

A Multi-Site Test Solution for Quadrature Modulation RF Transceivers.

[BibT_eX]

[DOI]

Gurusubrahmaniyan Subrahmaniyan Radhakrishnan

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation.

[BibT_eX]

[DOI]

J. Electron. Test., 2011

An industrial case study of analog fault modeling.

[BibT_eX]

[DOI]

Anne Meixner

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Adaptive multidimensional outlier analysis for analog and mixed signal circuits.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2011

Fast and Accurate DPPM Computation Using Model Based Filtering.

[BibT_eX]

[DOI]

Proceedings of the 16th European Test Symposium, 2011

Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study.

[BibT_eX]

[DOI]

Proceedings of the 16th European Test Symposium, 2011

Extraction of EVM from Transmitter System Parameters.

[BibT_eX]

[DOI]

Proceedings of the 16th European Test Symposium, 2011

2010

Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2010

Low Cost MIMO Testing for RF Integrated Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2010

Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs.

[BibT_eX]

[DOI]

Sudarshan Bahukudumbi

Vikram Iyengar

IEEE Trans. Very Large Scale Integr. Syst., 2009

Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources.

[BibT_eX]

[DOI]

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Built-in EVM measurement for OFDM transceivers using all-digital DFT.

[BibT_eX]

[DOI]

Proceedings of the 2009 IEEE International Test Conference, 2009

Defect-based test optimization for analog/RF circuits for near-zero DPPM applications.

[BibT_eX]

[DOI]

Haralampos-G. D. Stratigopoulos

Proceedings of the 27th International Conference on Computer Design, 2009

Defect Filter for Alternate RF Test.

[BibT_eX]

[DOI]

Salvador Mir

Proceedings of the 14th IEEE European Test Symposium, 2009

Adaptive test elimination for analog/RF circuits.

[BibT_eX]

[DOI]

Proceedings of the 46th Design Automation Conference, 2009

2008

Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling.

[BibT_eX]

[DOI]

Plamen K. Nikolov

ACM Trans. Design Autom. Electr. Syst., 2008

Defect-Oriented Testing of RF Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Optimized EVM Testing for IEEE 802.11a/n RF ICs.

[BibT_eX]

[DOI]

Proceedings of the 2008 IEEE International Test Conference, 2008

Diagnosis of assembly failures for System-in-Package RF tuners.

[BibT_eX]

[DOI]

Philippe Cauvet

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

Dynamic test scheduling for analog circuits for improved test quality.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on Computer Design, 2008

Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching.

[BibT_eX]

[DOI]

Proceedings of the 5th Conference on Computing Frontiers, 2008

2007

Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2007

Statistical Test Development for Analog Circuits Under High Process Variations.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

Online diagnosis of hard faults in microprocessors.

[BibT_eX]

[DOI]

Fred A. Bower

ACM Trans. Archit. Code Optim., 2007

VariaSim: simulating circuits and systems in the presence of process variability.

[BibT_eX]

[DOI]

SIGARCH Comput. Archit. News, 2007

A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up.

[BibT_eX]

[DOI]

Kevin B. Redmond

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Efficient simulation of parametric faults for multi-stage analog circuits.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

Test yield estimation for analog/RF circuits over multiple correlated measurements.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

Low cost characterization of RF transceivers through IQ data analysis.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor.

[BibT_eX]

[DOI]

Mahmut Yilmaz

Proceedings of the 25th International Conference on Computer Design, 2007

Digital calibration of RF transceivers for I-Q imbalances and nonlinearity.

[BibT_eX]

[DOI]

Proceedings of the 25th International Conference on Computer Design, 2007

Lazy Error Detection for Microprocessor Functional Units.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

An ADC-BiST scheme using sequential code analysis.

[BibT_eX]

[DOI]

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.

[BibT_eX]

[DOI]

Sudarshan Bahukudumbi

Vikram Iyengar

Proceedings of the 12th Conference on Asia South Pacific Design Automation, 2007

Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation.

[BibT_eX]

[DOI]

Proceedings of the 16th International Conference on Parallel Architectures and Compilation Techniques (PACT 2007), 2007

2006

Test infrastructure design for mixed-signal SOCs with wrapped analog cores.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2006

Concurrent testing of digital microfluidics-based biochips.

[BibT_eX]

[DOI]

Fei Su

ACM Trans. Design Autom. Electr. Syst., 2006

Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements.

[BibT_eX]

[DOI]

Martin A. Brooke

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems.

[BibT_eX]

[DOI]

Fei Su

J. Electron. Test., 2006

Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework.

[BibT_eX]

[DOI]

Plamen K. Nikolov

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Applying architectural vulnerability Analysis to hard faults in the microprocessor.

[BibT_eX]

[DOI]

Proceedings of the Joint International Conference on Measurement and Modeling of Computer Systems, 2006

Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Test Conference, 2006

A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Test Conference, 2006

Efficient Testing of RF MIMO Transceivers Used in WLAN Applications.

[BibT_eX]

[DOI]

Proceedings of the 24th International Conference on Computer Design (ICCD 2006), 2006

Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers.

[BibT_eX]

[DOI]

Kevin B. Redmond

Proceedings of the 2006 International Conference on Computer-Aided Design, 2006

2005

Autonomic Microprocessor Execution via Self-Repairing Arrays.

[BibT_eX]

[DOI]

Fred A. Bower

IEEE Trans. Dependable Secur. Comput., 2005

Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

A Mechanism for Online Diagnosis of Hard Faults in Microprocessors.

[BibT_eX]

[DOI]

Fred A. Bower

Proceedings of the 38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-38 2005), 2005

Defect-based RF testing using a new catastrophic fault model.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.

[BibT_eX]

[DOI]

Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005

Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.

[BibT_eX]

[DOI]

Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005

Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions.

[BibT_eX]

[DOI]

Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores.

[BibT_eX]

[DOI]

Proceedings of the 2005 Design, 2005

Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing.

[BibT_eX]

[DOI]

Proceedings of the 2005 Design, 2005

Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.

[BibT_eX]

[DOI]

Jonathan R. Carter

Proceedings of the 2005 Design, 2005

Hierarchical analysis of process variation for mixed-signal systems.

[BibT_eX]

[DOI]

Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005

2004

Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2004

Seamless Test of Digital Components in Mixed-Signal Paths.

[BibT_eX]

[DOI]

Ismet Bayraktaroglu

IEEE Des. Test Comput., 2004

Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures.

[BibT_eX]

[DOI]

Christian Olgaard

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 2004

Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search.

[BibT_eX]

[DOI]

Martin A. Brooke

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

Tolerating Hard Faults in Microprocessor Array Structures.

[BibT_eX]

[DOI]

Proceedings of the 2004 International Conference on Dependable Systems and Networks (DSN 2004), 28 June, 2004

2003

Statistical Tolerance Analysis for Assured Analog Test Coverage.

[BibT_eX]

[DOI]

J. Electron. Test., 2003

Testing of Droplet-Based Microelectrofluidic Systems.

[BibT_eX]

[DOI]

Fei Su

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.

[BibT_eX]

[DOI]

Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

2002

Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers.

[BibT_eX]

[DOI]

Christian Olgaard

IEEE Des. Test Comput., 2002

Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

An Integrated Tool for Analog Test Generation and Fault Simulation.

[BibT_eX]

[DOI]

Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

Automated test development and test time reduction for RF subsystems.

[BibT_eX]

[DOI]

Hosam Haggag

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits.

[BibT_eX]

[DOI]

Proceedings of the 20th International Conference on Computer Design (ICCD 2002), 2002

2001

Testability implications in low-cost integrated radio transceivers: a Bluetooth case study.

[BibT_eX]

[DOI]

Christian Olgaard

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Block-Based Test Integration for Analog Integrated Circuits.

[BibT_eX]

Proceedings of the 1st Latin American Test Workshop, 2000

Test Synthesis for Mixed-Signal SOC Paths.

[BibT_eX]

[DOI]

Ismet Bayraktaroglu

Proceedings of the 2000 Design, 2000

1999

Low-Cost Test for Large Analog IC's.

[BibT_eX]

[DOI]