Hussain Al-Asaad

According to our database1, Hussain Al-Asaad authored at least 31 papers between 1993 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Advancements in Secure Computing: Exploring Automated Repair Debugging and Verification Techniques for Hardware Design.
Proceedings of the 14th IEEE Annual Computing and Communication Workshop and Conference, 2024

2022
A Brief Survey of Fault Tolerant Techniques for Field Programmable Gate Arrays.
Proceedings of the 12th IEEE Annual Computing and Communication Workshop and Conference, 2022

2010
Efficient techniques for reducing error latency in on-line periodic built-in self-test.
IEEE Instrum. Meas. Mag., 2010

A Comparison of NMOS to PMOS Starved Buffer Implementations for the Delay Line in a PWM DC-DC Converters.
Proceedings of the 2010 International Conference on Computer Design, 2010

Time-Redundant Logic-Level Protection Mechanisms from Soft Errors in Digital Systems.
Proceedings of the 2010 International Conference on Computer Design, 2010

2009
Low Power Methodologies and Challenges for PWM DC-DC Converters.
Proceedings of the 2009 International Conference on Computer Design, 2009

Detection and Isolation of Faulty Processors in Multiprocessor Systems via TMR-Based Time Redundant Task Scheduling.
Proceedings of the 2009 International Conference on Computer Design, 2009

2008
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions.
IEEE Trans. Very Large Scale Integr. Syst., 2008

2007
A New Statistical Approach for Glitch Estimation in Combinational Circuits.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

Efficient Global Fault Collapsing for Combinational Library Modules.
Proceedings of the 2007 International Conference on Computer Design, 2007

2006
Circuit Profiling Mechanisms for High-Level {ATPG}.
Proceedings of the Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), 2006

Survey and Evaluation of Low-Power Flip-Flops.
Proceedings of the 2006 International Conference on Computer Design & Conference on Computing in Nanotechnology, 2006

2005
Search-Space Optimizations for High-Level ATPG.
Proceedings of the Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), 2005

EGFC: An exact global fault collapsing tool for combinational circuits.
Proceedings of the Third IASTED International Conference on Circuits, 2005

MVP: a mutation-based validation paradigm.
Proceedings of the Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30, 2005

On Increasing the Observability of Modern Microprocessors.
Proceedings of the 2005 International Conference on Computer Design, 2005

A Novel Functional Testing and Verification Technique for Logic Circuits.
Proceedings of the 2005 International Conference on Computer Design, 2005

2004
Mutation-based validation of high-level microprocessor implementations.
Proceedings of the Ninth IEEE International High-Level Design Validation and Test Workshop 2004, 2004

Survey and Evaluation of Low-Power Full-Adder Cells.
Proceedings of the International Conference on Embedded Systems and Applications, 2004

Approaches for Monitoring Vectors on Microprocessor Buses.
Proceedings of the International Conference on Embedded Systems and Applications, 2004

2003
Fault Tolerance for Multiprocessor Systems Via Time Redundant Task Scheduling.
Proceedings of the International Conference on VLSI, 2003

2000
Logic Design Validation via Simulation and Automatic Test Pattern Generation.
J. Electron. Test., 2000

ESIM: A Multimodel Design Error and Fault Simulator for Logic Circuits.
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

1998
Lifetime validation of digital systems via fault modeling and test generation.
PhD thesis, 1998

High-level design verification of microprocessors via error modeling.
ACM Trans. Design Autom. Electr. Syst., 1998

Scalable Test Generators for High-Speed Datapath Circuits.
J. Electron. Test., 1998

Online BIST for Embedded Systems.
IEEE Des. Test Comput., 1998

1995
Design verification via simulation and automatic test pattern generation.
Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995

1994
Distributed Reconfiguration of Fault Tolerant VLSI Mulipipeline Arrays with Constant Interstage Path Lengths.
Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994

1993
Concurrent error correction in iterative circuits by recomputing with partitioning and voting.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

A Two-Phase Reconfiguration Strategy for Extracting Linear Arrays Out of Two-Dimensional Architectures.
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993


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