Hyun-Chul Choi

Orcid: 0000-0002-3991-9466

Affiliations:
  • Yeungnam University, Daehakro, Gyeongsan, Gyeongbuk, Korea


According to our database1, Hyun-Chul Choi authored at least 18 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
One-shot font generation via local style self-supervision using Region-Aware Contrastive Loss.
J. King Saud Univ. Comput. Inf. Sci., 2024

2023
Non-parametric style transfer: Correlation-aware exact distribution matching.
J. King Saud Univ. Comput. Inf. Sci., December, 2023

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application.
Adv. Intell. Syst., December, 2023

CaPTURe: Cartoon Pose Transfer Using Reverse Attention.
Neurocomputing, October, 2023

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development.
Adv. Intell. Syst., September, 2023

Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning.
IEEE Access, 2023

2022
A Review of Multi-Modal Learning from the Text-Guided Visual Processing Viewpoint.
Sensors, 2022

Arbitrary Font Generation by Encoder Learning of Disentangled Features.
Sensors, 2022

Compact Image-Style Transfer: Channel Pruning on the Single Training of a Network.
Sensors, 2022

Total Style Transfer with a Single Feed-Forward Network.
Sensors, 2022

Toward Exploiting Second-Order Feature Statistics for Arbitrary Image Style Transfer.
Sensors, 2022

Part Affinity Fields and CoordConv for Detecting Landmarks of Lumbar Vertebrae and Sacrum in X-ray Images.
Sensors, 2022

Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm.
IEEE Access, 2022

2021
Uncorrelated feature encoding for faster image style transfer.
Neural Networks, 2021

Parallelization of Non-Maximum Suppression.
IEEE Access, 2021

2020
Artifact-Free Image Style Transfer by Using Feature Map Clamping.
IEEE Access, 2020

Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing.
IEEE Access, 2020

Unbiased Image Style Transfer.
IEEE Access, 2020


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