Seungjoon Eom

According to our database, Seungjoon Eom authored at least 6 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Machine Learning-Driven Extraction of Hybrid Compact Models Integrating Neural Networks and Berkeley Short-Channel Insulated-Gate Field-Effect Transistor Model-Common Multigate for Multidevice Applications.

Seungjoon Eom, Seunghwan Lee, Hyeok Yun, Kyeongrae Cho, Soomin Kim, Rock-Hyun Baek

Adv. Intell. Syst., 2025

2024

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring.

Hyeok Yun, Hyundong Jang, Seunghwan Lee, Junjong Lee, Kyeongrae Cho, Seungjoon Eom, Soomin Kim, Choong-Ki Kim, Hong-Chul Byun, Seongjoo Han, Min-Soo Yoo, Rock-Hyun Baek

Adv. Intell. Syst., October, 2024

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation.

Seungjoon Eom, Hyeok Yun, Hyundong Jang, Kyeongrae Cho, Seunghwan Lee, Jinsu Jeong, Rock-Hyun Baek

Adv. Intell. Syst., April, 2024

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations.

Seunghwan Lee, Seungjoon Eom, Jinsu Jeong, Junjong Lee, Sanguk Lee, Hyeok Yun, Yonghwan Ahn, Rock-Hyun Baek

IEEE Access, 2024

2023

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application.

Kyeongrae Cho, Jeong-Sik Lee, Chanyang Park, Hyeok Yun, Hyundong Jang, Seungjoon Eom, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek

Adv. Intell. Syst., December, 2023

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development.

Hyeok Yun, Chang-Hyeon An, Hyundong Jang, Kyeongrae Cho, Jeong-Sik Lee, Seungjoon Eom, Choong-Ki Kim, Min-Soo Yoo, Hyun-Chul Choi, Rock-Hyun Baek

Adv. Intell. Syst., September, 2023