Hyeok Yun

Orcid: 0000-0003-4597-4389

According to our database1, Hyeok Yun authored at least 14 papers between 2019 and 2026.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
In-Context Examples Suppress Scientific Knowledge Recall in LLMs.
CoRR, April, 2026

Ideological Bias in LLMs' Economic Causal Reasoning.
CoRR, April, 2026

2025
Machine Learning-Driven Extraction of Hybrid Compact Models Integrating Neural Networks and Berkeley Short-Channel Insulated-Gate Field-Effect Transistor Model-Common Multigate for Multidevice Applications.
Adv. Intell. Syst., 2025

Tracking Economic Disparities in North Korea: Satellite Imagery Analysis Using AI with Policy Insights.
Proceedings of the 2025 International Conference on Information Technology for Social Good, 2025

2024
Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring.
Adv. Intell. Syst., October, 2024

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation.
Adv. Intell. Syst., April, 2024

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations.
IEEE Access, 2024

2023
Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application.
Adv. Intell. Syst., December, 2023

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development.
Adv. Intell. Syst., September, 2023

Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning.
IEEE Access, 2023

2022
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm.
IEEE Access, 2022

2021
Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning.
IEEE Access, 2021

2020
Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing.
IEEE Access, 2020

2019
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node.
IEEE Access, 2019


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