Jaehyuk Lim

According to our database, Jaehyuk Lim authored at least 11 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Study of 3-D Line Edge Roughness (LER) in Vertical Channel Array Transistor for DRAM.

Jaehyuk Lim, Seokchan Yoon, Juho Sung, Sanghyun Kang, Gwon Kim, Hyoung Won Baac, Changhwan Shin

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., September, 2025

Device Design Guidelines to Boost Up AC Performance of CFET (Complementary Field-Effect-Transistor)-Based Inverter.

Jaehyuk Lim, Donghwan Han, Juho Sung, Seokchan Yoon, Sanghyun Kang, Gwon Kim, Hyoung Won Baac, Changhwan Shin

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., August, 2025

Utility Engineering: Analyzing and Controlling Emergent Value Systems in AIs.

Mantas Mazeika, Xuwang Yin, Rishub Tamirisa, Jaehyuk Lim, Bruce W. Lee, Richard Ren, Long Phan, Norman Mu, Adam Khoja, Oliver Zhang, Dan Hendrycks

CoRR, February, 2025

Robust Anti-Jamming Method for Large-Array Radar Systems Using Deep Learning Based Null-Space Beamforming.

Jaehyuk Lim, Hogeun Yoo, Euihyuk Lee, Sunjin Oh, Jaehoon Lee

IEEE Access, 2025

2024

Measuring Visual Sycophancy in Multimodal Models.

Jaehyuk Lim, Bruce W. Lee

CoRR, 2024

Tasks That Language Models Don't Learn.

Bruce W. Lee, Jaehyuk Lim

CoRR, 2024

Language Models Don't Learn the Physical Manifestation of Language.

Bruce W. Lee, Jaehyuk Lim

Proceedings of the 62nd Annual Meeting of the Association for Computational Linguistics (Volume 1: Long Papers), 2024

2022

GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET.

Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon

IEEE Access, 2022

2021

Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET.

Jaehyuk Lim, Jinwoong Lee, Changhwan Shin

IEEE Access, 2021

2020

Machine Learning (ML)-Based Model to Characterize the Line Edge Roughness (LER)-Induced Random Variation in FinFET.

Jaehyuk Lim, Changhwan Shin

IEEE Access, 2020

2019

A Novel Method Using a Rectangular Groove to Reduce Far-End Crosstalk in Microstrip Lines Covered With a Dielectric Layer.

Jaehyuk Lim, Seungjin Lee, Youngjin Jeong, Jaehoon Lee

IEEE Access, 2019